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VND5004DSP30

Electrical specifications

27

Table 11. Electrical transient requirements (part 1/3)

ISO 7637-2:

2004(E)

test pulse

Number of

pulses or

test times

Burst cycle/pulse repetition

time

Delays and

impedance

III

IV

1

-75 V

-100 V

5000 pulses

0.5 s

5 s

2 ms, 10

Ω

2a

+37 V

+50 V

5000 pulses

0.2 s

5 s

50 µs, 2

Ω

3a

-100 V

-150 V

1h

90 ms

100 ms

0.1 µs, 50

Ω

3b

+75 V

+100 V

1h

90 ms

100 ms

0.1 µs, 50

Ω

4

-6 V

-7 V

1 pulse

100 ms, 0.01

Ω

+65 V

+87 V

1 pulse

400 ms, 2

Ω

1.

2.

Valid in case of external load dump clamp: 40V maximum referred to ground. The protection strategy allows PowerMOS to

be cyclically switched on during load dump, so distributing the load dump energy along the time and to transfer a part of it

to the load.

Table 12. Electrical transient requirements (part 2/3)

ISO 7637-2: 2004(E)

test pulse

III

IV

1C

C

2a

C

C

3a

C

C

3b

C

C

4C

C

CC

1.

2.

Valid in case of external load dump clamp: 40V maximum referred to ground. The protection strategy allows PowerMOS to

be cyclically switched on during load dump, so distributing the load dump energy along the time and to transfer a part of it

to the load.

3.

Suppressed load dump (pulse 5b) is withstood with a minimum load connected as specified in Table 3.: Absolute maximum

ratings.

Table 13. Electrical transient requirements (part 3/3)

Class

Contents

C

All functions of the device are performed as designed after exposure to disturbance.

E

One or more functions of the device are not performed as designed after exposure to

disturbance and cannot be returned to proper operation without replacing the device.