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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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LSF0204 датащи(PDF) 8 Page - Texas Instruments |
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LSF0204 датащи(HTML) 8 Page - Texas Instruments |
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8 / 32 page  From Output Under Test 500 S1 Vref_B Open 15 pF TEST S1 t /t PZL PLZ Vref_B NOTES: A. CL includes probe and jig capacitance. B. All input pulses are supplied by generators having the following characteristics: PRR ≤ ≤ ≤ 10 MHz, Z = 50 t 2 ns, t O r f Ω, 2ns. C. The outputs are measured one at a time, with one transition per measurement. From Output Under Test CL (see Note A) LOAD CIRCUIT TRANSLATING UP TRANSLATING DOWN RL Translating up Translating down S1 S2 USAGE SWITCH VM VM 3.3 V VIL Input VM VM 5 V VOL Output VM VM 5 V VIL Input VM VM 2 V VOL Output VT S1 S2 Open LSF0204, LSF0204D SLVSCP5D – JULY 2014 – REVISED DECEMBER 2015 www.ti.com 9 Parameter Measurement Information Figure 5. Load Circuit for Outputs Figure 6. Load Circuit for Enable/Disable Time Measurement 8 Submit Documentation Feedback Copyright © 2014–2015, Texas Instruments Incorporated Product Folder Links: LSF0204 LSF0204D |
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