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REF5010 датащи(PDF) 16 Page - Texas Instruments |
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REF5010 датащи(HTML) 16 Page - Texas Instruments |
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16 / 38 page ![]() PRE POST 6 HYST NOM V V V 10 (ppm) V æ ö - = × ç ÷ ç ÷ è ø Drift V OUTMAX V OUTMIN V OUT Tem p Range 106(ppm) = ( – × ) × DNC TEMP V OUT V IN GND DNC NC TRIM/NR REF50xx V TEMP 2.6mV/ C ° OPA(1) NOTE:(1)Lowdriftopamp,suchastheOPA333,OPA335,orOPA376. +V REF5010, REF5020, REF5025, REF5030 REF5040, REF5045, REF5050 SBOS410G – JUNE 2007 – REVISED NOVEMBER 2015 www.ti.com Feature Description (continued) Figure 37. Buffering the TEMP Pin Output 9.3.2 Temperature Drift The REF50xx is designed for minimal drift error, which is defined as the change in output voltage over temperature. The drift is calculated using the box method, as described show in Equation 2. (2) The REF50xx features a maximum drift coefficient of 3 ppm/°C for the high-grade version, and 8 ppm/°C for the standard-grade. 9.3.3 Thermal Hysteresis Thermal hysteresis for the REF50xx is defined as the change in output voltage after operating the device at 25°C, cycling the device through the specified temperature range, and returning to 25°C. It can be expressed as Equation 3: where • VHYST = thermal hysteresis (in units of ppm). • VNOM = the specified output voltage. • VPRE = output voltage measured at 25°C pretemperature cycling. • VPOST = output voltage measured after the device has been cycled from 25°C through the specified temperature range of –40°C to 125°C and returned to 25°C. (3) 9.3.4 Noise Performance Typical 0.1-Hz to 10-Hz voltage noise for each member of the REF50xx family is specified in the table. The noise voltage increases with output voltage and operating temperature. Additional filtering can be used to improve output noise levels, although take care to ensure the output impedance does not degrade performance. For additional information about how to minimize noise and maximize performance in mixed-signal applications such as data converters, refer to the series of Analog Applications Journal articles entitled, How a Voltage Reference Affects ADC Performance. This three-part series is available for download from the TI website under three literature numbers: SLYT331, SLYT339, and SLYT355 for Part I, Part II, and Part III, respectively. 16 Submit Documentation Feedback Copyright © 2007–2015, Texas Instruments Incorporated Product Folder Links: REF5010 REF5020 REF5025 REF5030 REF5040 REF5045 REF5050 |
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