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100352 датащи(PDF) 5 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
номер детали 100352
подробное описание детали  Low Power 8-Bit Buffer with Cut-Off Drivers
PDF  8 Pages
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производитель  NSC [National Semiconductor (TI)]
домашняя страница  http://www.national.com
Logo NSC - National Semiconductor (TI)

100352 датащи(HTML) 5 Page - National Semiconductor (TI)

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AC Electrical Characteristics (Continued)
V
EE = −4.2V to −5.7V, VCC = VCCA = GND
Symbol
Parameter
T
C = −55˚C
T
C = +25˚C
T
C +125˚C
Units
Conditions
Notes
Min
Max
Min
Max
Min
Max
t
TLH
Transition Time
0.40
2.50
0.40
2.40
0.40
2.70
ns
Figures 1, 2
(Note 10)
t
THL
20% to 80%,80% to 20%
Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures.
Note 8: Screen tested 100% on each device at +25˚C temperature only, Subgroup A9.
Note 9: Sample tested (Method 5005, Table I) on each manufactured lot at +25˚C, Subgroup A9, and at +125˚C and −55˚C temperatures, Subgroups A10 and A11.
Note 10: Not tested at +25˚C, +125˚C, and −55˚C temperature (design characterization data).
Note 11: The propagation delay specified is for single output switching. Delays may vary up to 300 ps with multiple outputs switching.
Test Circuitry
Switching Waveforms
DS100296-6
Notes:
VCC,VCCA = +2V, VEE = −2.5V
L1 and L2 = equal length 50
Ω impedance lines
RT = 50Ω terminator internal to scope
Decoupling 0.1 µF from GND to VCC and VEE
All unused outputs are loaded with 25
Ω to GND
CL = Fixture and stray capacitance ≤ 3pF
FIGURE 1. AC Test Circuit
DS100296-7
Note:
The output AC measurement point for cut-off propagation delay
testing = the 50% voltage point between active VOL and VOH.
FIGURE 2. Propagation Delay, Cut-Off and Transition Times
www.national.com
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