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LM62 датащи(PDF) 3 Page - Texas Instruments |
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LM62 датащи(HTML) 3 Page - Texas Instruments |
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3 / 15 page ![]() LM62 www.ti.com SNIS105E – JUNE 1999 – REVISED MARCH 2013 Electrical Characteristics Unless otherwise noted, these specifications apply for +VS = +3.0 VDC. Boldface limits apply for TA = TJ = TMIN to TMAX ; all other limits TA = TJ = 25°C. Parameter Conditions Typical(1) LM62B LM62C Units (Limit) Limits(2) Limits(2) Accuracy(3) ±2.0 ±3.0 °C (max) +2.5/ −2.0 +4.0/ −3.0 °C (max) Output Voltage at 0°C +480 mV Nonlinearity(4) ±0.8 ±1.0 °C (max) Sensor Gain +16.1 +16.3 mV/°C (max) +16 (Average Slope) +15.1 +14.9 mV/°C (min) Output Impedance +3.0V ≤ +VS ≤ +10V 4.7 4.7 k Ω (max) 0°C ≤ TA ≤ +75°C, +VS= +2.7V 4.4 4.4 k Ω (max) Line Regulation(5) +3.0V ≤ +VS ≤ +10V ±1.13 ±1.13 mV/V (max) +2.7V ≤ +VS ≤ +3.3V, 0°C ≤ TA ≤ +75°C ±9.7 ±9.7 mV (max) Quiescent Current +2.7V ≤ +VS ≤ +10V 130 130 μA (max) 82 165 165 μA (max) Change of Quiescent Current +2.7V ≤ +VS ≤ +10V ±5 μA Temperature Coefficient of 0.2 μA/°C Quiescent Current Long Term Stability(6) TJ=TMAX=+100°C, ±0.2 °C for 1000 hours (1) Typicals are at TJ = TA = 25°C and represent most likely parametric norm. (2) Limits are ensured to Texas Instruments' AOQL (Average Outgoing Quality Level). (3) Accuracy is defined as the error between the output voltage and +15.6 mV/°C times the device's case temperature plus 480 mV, at specified conditions of voltage, current, and temperature (expressed in °C). (4) Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the device's rated temperature range. (5) Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed by multiplying the internal dissipation by the thermal resistance. (6) For best long-term stability, any precision circuit will give best results if the unit is aged at a warm temperature, and/or temperature cycled for at least 46 hours before long-term life test begins. This is especially true when a small (Surface-Mount) part is wave-soldered; allow time for stress relaxation to occur. The majority of the drift will occur in the first 1000 hours at elevated temperatures. The drift after 1000 hours will not continue at the first 1000 hour rate. Copyright © 1999–2013, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Links: LM62 |
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