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LM62 датащи(PDF) 3 Page - Texas Instruments

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номер детали LM62
подробное описание детали  2.7V, 15.6 mV/째C SOT-23 Temperature Sensor
PDF  15 Pages
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производитель  TI [Texas Instruments]
домашняя страница  http://www.ti.com
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LM62 датащи(HTML) 3 Page - Texas Instruments

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LM62
www.ti.com
SNIS105E – JUNE 1999 – REVISED MARCH 2013
Electrical Characteristics
Unless otherwise noted, these specifications apply for +VS = +3.0 VDC. Boldface limits apply for TA = TJ = TMIN to TMAX ; all
other limits TA = TJ = 25°C.
Parameter
Conditions
Typical(1)
LM62B
LM62C
Units
(Limit)
Limits(2)
Limits(2)
Accuracy(3)
±2.0
±3.0
°C (max)
+2.5/
−2.0
+4.0/
−3.0
°C (max)
Output Voltage at 0°C
+480
mV
Nonlinearity(4)
±0.8
±1.0
°C (max)
Sensor Gain
+16.1
+16.3
mV/°C (max)
+16
(Average Slope)
+15.1
+14.9
mV/°C (min)
Output Impedance
+3.0V
≤ +VS ≤ +10V
4.7
4.7
k
Ω (max)
0°C
≤ TA ≤ +75°C, +VS= +2.7V
4.4
4.4
k
Ω (max)
Line Regulation(5)
+3.0V
≤ +VS ≤ +10V
±1.13
±1.13
mV/V (max)
+2.7V
≤ +VS ≤ +3.3V, 0°C ≤ TA ≤ +75°C
±9.7
±9.7
mV (max)
Quiescent Current
+2.7V
≤ +VS ≤ +10V
130
130
μA (max)
82
165
165
μA (max)
Change of Quiescent Current
+2.7V
≤ +VS ≤ +10V
±5
μA
Temperature Coefficient of
0.2
μA/°C
Quiescent Current
Long Term Stability(6)
TJ=TMAX=+100°C,
±0.2
°C
for 1000 hours
(1)
Typicals are at TJ = TA = 25°C and represent most likely parametric norm.
(2)
Limits are ensured to Texas Instruments' AOQL (Average Outgoing Quality Level).
(3)
Accuracy is defined as the error between the output voltage and +15.6 mV/°C times the device's case temperature plus 480 mV, at
specified conditions of voltage, current, and temperature (expressed in °C).
(4)
Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the device's
rated temperature range.
(5)
Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating
effects can be computed by multiplying the internal dissipation by the thermal resistance.
(6)
For best long-term stability, any precision circuit will give best results if the unit is aged at a warm temperature, and/or temperature
cycled for at least 46 hours before long-term life test begins. This is especially true when a small (Surface-Mount) part is wave-soldered;
allow time for stress relaxation to occur. The majority of the drift will occur in the first 1000 hours at elevated temperatures. The drift after
1000 hours will not continue at the first 1000 hour rate.
Copyright © 1999–2013, Texas Instruments Incorporated
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