Rev. 7

Safety Certified Multilayer

Ceramic Chip Capacitor

RoHS

MERITEK

(X1/Y2, X2/Y3)

3,300pF (332)

G

3,900pF (392)

G

2,700pF (272)

G

4,700pF (472)

G

5,600pF (562)

G

No.

Item

Standard

Method

Test Condition

Requirements

1. Visual

examination

and

Dimensions

IEC 60384-1

4.1

* No remarkable defect.

* Dimensions to confirm to individual specification sheet.

2. Capacitance IEC 60384-1

4.2.2

Class I (C0G/NPO): 1.0±0.2Vrms,

Class II (X7R): 1.0±0.2Vrms, 1KHz±10%

* Capacitance is within specified tolerance

values given in IEC 60063.

3. D.F.

(Dissipation

Factor)

Tangent of

loos angle

IEC 60384-1

4.2.3

Class I (C0G/NPO)

: Cap≥30pF, D.F≤0.1%;

Cap<30pF, D.F

≤1/(400+20C)

Class II (X7R)

: ≤2.5%

4. Temperature

Coefficient

IEC

60384-21/22

4.6

With no electrical load.

T.C.

Operating Temp

C0G(NPO)

-55~125°C at 25°C

X7R

-55~125°C at 25°C

T.C.

Capacitance C ange

C0G(NPO)

Within ±30ppm/

℃

X7R

Within ±15%

5. Insulation

Resistance

IEC

60384-21/22

4.5.3

* The charge current shall not exceed 0.05A.

Class I (NP0)

:

≥ 100GΩ or RxC ≥ 1000 Ω-F whichever is

smaller.

Class II (X7R)

:

≥ 10GΩ or RxC ≥ 500 Ω-F whichever is smaller.

6. Voltage

proof

(Dielectric

Strength)

IEC 60384-14

4.2.1

* To apply voltage:

* Duration: 60 sec.

* The charge current shall not exceed

0.05A.

* No evidence of damage or flashover during test.

* The voltage shall be raised from the near zero to the test voltage a

rate not exceeding 150V(r.m.s.)/sec.

7. Solderability IEC

60384-21/22

4.10

* Solder temperature: 245±5°C

* Dipping time: 2±0.2 sec.

75% min. coverage of all metalized area.

8. Resistance

to Soldering

Heat

IEC 60384-14

4.4

IEC

60384-21/22

4.9

* Solder temperature: 260±5°C

* Dipping time: 10±1 sec

* Preheating: 120 to 150°C for 1 minute

before immerse the capacitor in a eutectic

solder.

* Before initial measurement (Class II only):

Perform 150+0/-10°C for 1 hr and then set

for 48±4 hrs at room temp.

* Measurement to be made after keeping at

room temp. for 24±2 hrs (Class I) and 48±

4 hrs (Class II)

* No visible damage.

* Cap change:

NP0:

within ±2.5% or ±0.25pF whichever is larger.

I.R: More than 1G

Ω

X7R:

within ±10%

I.R: More than 1G

Ω

9. Humidity

(Damp Heat)

Steady State

IEC 60384-14

4.12

* Test temp.: 40±2°C

* Humidity: 90~95% RH

* Test time: 500+24/-0hrs.

* Measurement to be made after keeping at

room temp. for 24±2 hrs (Class I) and 48±

4 hrs (Class II)

* No remarkable damage.

* Cap change:

NP0 within ±5% or ±0.5pF whichever is larger

X7R within ±15%

* D.F Value:

NP0

≤ 0.25%

X7R: ≤5.0%

* I.R.

≥1GΩ

* Dielectric strength satisfies the specified initial value