2SC6096

No. A0434-2/6

Continued from preceding page.

Parameter

Symbol

Conditions

Ratings

Unit

Base Current

IB

400

mA

Collector Dissipation

PC

1.3

W

Tc=25°C

3.5

W

Junction Temperature

Tj

150

°C

Storage Temperature

Tstg

--55 to +150

°C

Electrical Characteristics at Ta=25°C

Parameter

Symbol

Conditions

Ratings

Unit

min

typ

max

Collector Cutoff Current

ICBO

VCB=80V, IE=0A

1

μA

Emitter Cutoff Current

IEBO

VEB=4V, IC=0A

1

μA

DC Current Gain

hFE

VCE=5V, IC=100mA

300

600

Gain-Bandwidth Product

fT

VCE=10V, IC=300mA

300

MHz

Output Capacitance

Cob

VCB=10V, f=1MHz

13

pF

Collector-to-Emitter Saturation Voltage

VCE(sat)

IC=1A, IB=100mA

100

150

mV

Base-to-Emitter Saturation Voltage

VBE(sat)

IC=1A, IB=100mA

0.85

1.2

V

Collector-to-Base Breakdown Voltage

V(BR)CBO

IC=10μA, IE=0A

120

V

Collector-to-Emitter Breakdown Voltage

V(BR)CES

IC=100μA, RBE=0Ω

120

V

V(BR)CEO

IC=1mA, RBE=∞

100

V

Emitter-to-Base Breakdown Voltage

V(BR)EBO

IE=10μA, IC=0A

6.5

V

Turn-ON Time

ton

See specified Test Circuit.

40

ns

Storage Time

tstg

1100

ns

Fall Time

tf

40

ns

Switching Time Test Circuit

Ordering Information

Device

Package

Shipping

memo

2SC6096-TD-E

PCP

1,000pcs./reel

Pb Free

2SC6096-TD-H

PCP

1,000pcs./reel

Pb Free and Halogen Free

VR10

RB

VCC=50V

IC=10IB1= --10IB2=0.5A

VBE= --5V

+

+

50Ω

INPUT

OUTPUT

RL

100μF

470μF

PW=20μs

IB1

D.C.≤1%

IB2

2.0

1.6

1.2

0.8

0.4

0.2

1.8

1.4

1.0

0.6

0

2.0

1.6

1.2

0.4

0.2

0.8

1.8

1.4

0.6

1.0

0

0.2

0.1

0

0.4

0.6

0.8

0.3

0.5

0.7

0.9

1.0

IT11115

10mA

20mA

40mA

80mA

IB=0mA

5mA

2mA

VCE=5V

0

0.2

0.4

0.6

0.8

1.2

1.0

IT11116

60mA

IC -- VCE

Collector-to-Emitter Voltage, VCE -- V

IC -- VBE

Base-to-Emitter Voltage, VBE -- V

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating

Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.