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PYA28C64-35CWM датащи(PDF) 3 Page - Pyramid Semiconductor Corporation

номер детали PYA28C64-35CWM
подробное описание детали  Access Times of 150, 200, 250 and 350ns Fast Byte Write (200us or 1 ms)
PDF  10 Pages
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производитель  PYRAMID [Pyramid Semiconductor Corporation]
домашняя страница  http://www.pyramidsemiconductor.com
Logo PYRAMID - Pyramid Semiconductor Corporation

PYA28C64-35CWM датащи(HTML) 3 Page - Pyramid Semiconductor Corporation

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PYA28C64 - 8K x 8 EEPROM
Page 3
Document # EEPROM105 REV B
DC ELECTRICAL CHARACTERISTICS
(Over Recommended Operating Temperature & Supply Voltage)(2)
Sym Parameter
Test Conditions
PYA28C64
Unit
Min
Max
V
IH
Input High Voltage
2.0
V
CC + 0.3
V
V
IL
Input Low Voltage
-0.5(3)
0.8
V
V
HC
CMOS Input High Voltage
V
CC - 0.2
V
CC + 0.5
V
V
LC
CMOS Input Low Voltage
-0.5(3)
0.2
V
V
OL
Output Low Voltage (TTL Load)
I
OL = +2.1 mA, VCC = Min
0.45
V
V
OH
Output High Voltage (TTL Load)
I
OH = -0.4 mA, VCC = Min
2.4
V
I
LI
Input Leakage Current
V
CC = Max
V
IN = GND to VCC
-10
+10
µA
I
LO
Output Leakage Current
V
CC = Max, CE = VIH,
V
OUT = GND to VCC
-10
+10
µA
I
SB
Standby Power Supply Current (TTL Input Levels)
CE ≥ V
IH, OE = VIL,
V
CC = Max,
f = Max, Outputs Open
—
5
mA
I
SB1
Standby Power Supply Current (CMOS Input Levels)
CE ≥ V
HC,
V
CC = Max,
f = 0, Outputs Open,
V
IN ≤ VLC or VIN ≥ VHC
—
150
µA
I
CC
Supply Current
CE = OE = V
IL,
WE = V
IH,
All I/O's = Open,
Inputs = V
CC = 5.5V
—
60
mA
Notes:
1. Stresses greater than those listed under MAXIMUM RATINGS may
cause permanent damage to the device. This is a stress rating only
and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification
is not implied. Exposure to MAXIMUM rating conditions for extended
periods may affect reliability.
2. Extended temperature operation guaranteed with 400 linear feet per
minute of air flow.
3.TransientinputswithV
IL and IIL not more negative than -3.0V and -100mA,
respectively, are permissible for pulse widths up to 20ns.
4. This parameter is sampled and not 100% tested.



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