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AN4494 датащи(PDF) 20 Page - STMicroelectronics |
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AN4494 датащи(HTML) 20 Page - STMicroelectronics |
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20 / 34 page ![]() XTAL centering test AN4494 Set the spectrum analyzer to: Res BW = 1 KHz, SPAN = 500 KHz (see Figure 6: "Frequency tone at Ch0 for the XTAL center test"). Generate a carrier wave tone at Ch0 (freq. 2.401750 GHz) using the ACI command: HAL_TONE_START (a tone can be emitted at f = 2402 + k*2 - 0.250 MHz, with k = 0 to 39). The difference between the desired tone and the measured tone is the frequency offset. Figure 6: Frequency tone at Ch0 for the XTAL center test 5.6 Expected results The offset limit is (as reported in the Reference section point ): |Offset| < 50 KHz If DUT freq > 2.4018 GHz → increase XTAL caps If DUT freq < 2.4017 GHz → decrease XTAL caps 5.7 Note N/A. 5.8 Other N/A. 20/34 DocID026361 Rev 3 |
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