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RH27

rh27fd

TABLE 1A: ELECTRICAL CHARACTERISTICS

(Postirradiation) (Note 10)

SYMBOL PARAMETER

CONDITIONS

NOTES MIN

MAX

MIN

MAX

MIN

MAX

MIN

MAX

MIN

MAX

UNITS

VOS

Input Offset Voltage RH27E

RH27C

100

130

100

180

150

280

200

400

μV

IOS

Input Offset Current RH27E

RH27C

120

180

Input Bias Current

RH27E

RH27C

±40

±80

±50

±80

±125

±100

±200

±400

Input Resistance

Common Mode

RH27E

RH27C

3 (Typ)

2 (Typ)

3 (Typ)

2 (Typ)

3 (Typ)

2 (Typ)

3 (Typ)

2 (Typ)

3 (Typ)

2 (Typ)

GΩ

Input Voltage Range

±11

CMRR

Common Mode

Rejection Ratio

VCM = ±11V (RH27E)

VCM = ±11V (RH27C)

114

100

114

100

110

105

100

PSRR

Power Supply

Rejection Ratio

VS = ±4V to ±18V (RH27E)

VS = ±4V to ±18V (RH27C)

100

AVOL

Large-Signal

Voltage Gain

RL ≥ 2kΩ, VO = ±10V (RH27E)

RL ≥ 2kΩ, VO = ±10V (RH27C)

1000

700

1000

700

1000

700

900

700

800

400

V/mV

VOUT

Maximum Output

Voltage Swing

RL ≥ 2kΩ (RH27E)

RL ≥ 600Ω (RH27E)

RL ≥ 2kΩ (RH27C)

RL ≥ 600Ω (RH27C)

±12

±10

±11.5

±10

±12

±10

±11.5

±10

±12

±10

±11.5

±10

±12

±10

±11.5

±10

±12

±10

±11.5

±10

Open-Loop Output

Resistance

VO = 0, IO = 0

70 (Typ)

Power Dissipation

RH27E

RH27C

140

170

140

170

140

170

140

170

140

170

10KRAD(Si) 20KRAD(Si) 50KRAD(Si) 100KRAD(Si) 200KRAD(Si)

Note 6: See test circuit for current noise measurement on OP-27/OP-37

data sheet.

Note 7: The average input offset drift performance is within the

speciﬁcations unnulled or when nulled with a pot having a range 8kΩ to

20kΩ.

Note 8: The RH27’s inputs are protected by back-to-back diodes. Current

limiting resistors are not used in order to achieve low noise. If differential

input voltage exceeds ±0.7V, the input current should be limited to 25mA.

Note 9: VS = ±15V, VCM = 0V unless otherwise noted.

Note 10: TA = 25°C, VS = ±15V, VCM = 0V, unless otherwise noted.

Note 11: RH27AEW is marked and processed as RH27EW. Orders will be

delivered through box stock screening at 25°C, –55°C to 125°C to the VOS

speciﬁcation shown on Table 1.

Note 1: Input offset voltage measurements are performed by automatic

test equipment approximately 0.5 seconds after application of power.

Note 2: Long-term input offset voltage stability refers to the averaged

trend line of offset voltage vs time over extended periods after the ﬁrst

30 days of operation. Excluding the initial hour of operation, changes

in VOS during the ﬁrst 30 days are typically 2.5μV. Refer to the typical

performance curve.

Note 3: Sample tested to an LTPD of 15 on every lot. Contact factory for

100% testing of 10Hz voltage density noise.

Note 4: Parameter is guaranteed by design, characterization, or correlation

to other tested parameters.

Note 5: See test circuit and frequency response curve for 0.1Hz to 10Hz

tester on OP-27/OP-37 data sheet.

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