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AN1711 датащи(PDF) 28 Page - STMicroelectronics |
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AN1711 датащи(HTML) 28 Page - STMicroelectronics |
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28 / 40 page ![]() 28/40 SOFTWARE TECHNIQUES FOR COMPENSATING ST7 ADC ERRORS 3. The process can be automated using external calibration. A precise analog source can be used for this purpose. The software must make the communication between the source and the device under test. 4. Store the lookup table in EEPROM The lookup table for different values can be stored in the connected E2PROM. This will make it easy to update the lookup table by calibrating from time to time. This technique can be used in production. A known and precise analog input voltage source of is used in the test setup and the different voltages are produced. The communication between test setup and microcontroller provides the digital code that can be expected. The actual dig- ital code and expected digital code is then used for making the lookup table. 4.2.4 Linear compensation Linear compensation can be done using the datasheet values for Offset and Gain errors. The ideal transfer curve is a straight line from code 0 to 1023 for a 10-bit ADC. The actual ADC transfer curve is assumed to follow a straight line from first transition (digital code =1) to last transition (digital code = 1023). The first transition and last transition error values are known from the datasheet. If the Offset error is positive and the Gain error is negative then the available range is reduced. In this case the actual transfer curve will cross the ideal transfer curve. Figure 18. Offset and Gain error compensation To do linear compensation, the offset and gain errors can be spread over the full range. It can be noted from the transfer curve that positive offset errors cause the actual result to be re- VSSA 1023 Digital output (Decimal steps) Actual transfer curve Ideal transfer curve Vin Reduced Range Ideal range Gain error (negative) Offset Error (positive) Offset error positive Gain error negative |
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