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AN3031 датащи(PDF) 25 Page - STMicroelectronics

номер детали AN3031
подробное описание детали  SCLT3-8 input termination demonstration board
PDF  28 Pages
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производитель  STMICROELECTRONICS [STMicroelectronics]
домашняя страница  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

AN3031 датащи(HTML) 25 Page - STMicroelectronics

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AN3031
EMC testing
Doc ID 16144 Rev 1
25/28
7
EMC testing
The EMC requirements according to the IEC 61131-2 standard have been verified.
Application tests show much better results than given by the industrial standard. Test
requirements and results are listed in the table below. No additional protection devices have
been used in the application.
Table 2.
EMC immunity test requirements and results
Minimum requirements of international
standards
Robustness of the STEVAL-IFP007V1
Tests conditions
Levels
Tests conditions
Levels
Behavior of
the SCLT3-
8BT8
ESD test
IEC61000-4-2
Air discharge
±8 kV
RC = 1 kΩ
RIN = 2.2 kΩ
±8 kV
Contact discharge
±4 kV
RC = 1 kΩ
RIN = 2.2 kΩ
±6 kV
Burst test
IEC61000-4-4
Analog input
±1 kV
RIN = 2.2 kΩ C
IN = 1 nF
CC = 33 nF
±4 kV
±6 kV(1)
±8 kV (1),(2)
1.
Primary and secondary grounds of the optocouplers have been coupled with a 10 pF capacitor
2.
Forced input filtering capacitors to maximize EFT immunity (C40 - C55 = 22 nF) with a drawback of bandwidth reduction
(<10 kHz).
No failure, no
disturbance
DC power line
±2 kV
RC = 1 kΩ
SPI signals R-C filter:
220
Ω - 100 pF
Surge test
IEC61000-4-5
Analog input
42
Ω, 0.5 µF
differential and
common mode
±0.5 kV
Analog
input
RIN = 2.2 kΩ ±2 kV
No failure,
temporary
disturbance
DC power line
2
Ω, 18 µF
differential mode
±0.5 kV
DC power
line
RC = 1 kΩ
±2 kV
12
Ω, 9 µF
common mode
±1 kV
±2 kV
Conducted
disturbance
test
IEC61000-4-6
150 kHz to
80 MHz
22 nF capacitors
at the output
3 VRMS
AM ±
80%
150 kHz to
80 MHz
RIN = 2.2 kΩ
CIN = 1 nF at
the INPUT
10 VRMS
AM ± 80%
No failure, no
disturbance
Reverse input
polarity test
–VCC applied to one input during 10 s
–30 VDC applied to one input, +30 VDC
on the others
No failure, no
cross-talk



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