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AN3031 датащи(PDF) 25 Page - STMicroelectronics |
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AN3031 датащи(HTML) 25 Page - STMicroelectronics |
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25 / 28 page ![]() AN3031 EMC testing Doc ID 16144 Rev 1 25/28 7 EMC testing The EMC requirements according to the IEC 61131-2 standard have been verified. Application tests show much better results than given by the industrial standard. Test requirements and results are listed in the table below. No additional protection devices have been used in the application. Table 2. EMC immunity test requirements and results Minimum requirements of international standards Robustness of the STEVAL-IFP007V1 Tests conditions Levels Tests conditions Levels Behavior of the SCLT3- 8BT8 ESD test IEC61000-4-2 Air discharge ±8 kV RC = 1 kΩ RIN = 2.2 kΩ ±8 kV Contact discharge ±4 kV RC = 1 kΩ RIN = 2.2 kΩ ±6 kV Burst test IEC61000-4-4 Analog input ±1 kV RIN = 2.2 kΩ C IN = 1 nF CC = 33 nF ±4 kV ±6 kV(1) ±8 kV (1),(2) 1. Primary and secondary grounds of the optocouplers have been coupled with a 10 pF capacitor 2. Forced input filtering capacitors to maximize EFT immunity (C40 - C55 = 22 nF) with a drawback of bandwidth reduction (<10 kHz). No failure, no disturbance DC power line ±2 kV RC = 1 kΩ SPI signals R-C filter: 220 Ω - 100 pF Surge test IEC61000-4-5 Analog input 42 Ω, 0.5 µF differential and common mode ±0.5 kV Analog input RIN = 2.2 kΩ ±2 kV No failure, temporary disturbance DC power line 2 Ω, 18 µF differential mode ±0.5 kV DC power line RC = 1 kΩ ±2 kV 12 Ω, 9 µF common mode ±1 kV ±2 kV Conducted disturbance test IEC61000-4-6 150 kHz to 80 MHz 22 nF capacitors at the output 3 VRMS AM ± 80% 150 kHz to 80 MHz RIN = 2.2 kΩ CIN = 1 nF at the INPUT 10 VRMS AM ± 80% No failure, no disturbance Reverse input polarity test –VCC applied to one input during 10 s –30 VDC applied to one input, +30 VDC on the others No failure, no cross-talk |
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