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AN4075 датащи(PDF) 18 Page - STMicroelectronics

номер детали AN4075
подробное описание детали  STEVAL-IFP016V2 IO-Link communication master transceiver
PDF  23 Pages
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производитель  STMICROELECTRONICS [STMicroelectronics]
домашняя страница  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

AN4075 датащи(HTML) 18 Page - STMicroelectronics

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Application EMC immunity
AN4075
18/23
Doc ID 022954 Rev 1
4.2.2
Test signal
According the IEC 61000-4-4
Polarity: positive/negative
Burst duration: 15 ms ± 20% at 5 kHz
Burst period: 300 ms ± 20%
Duration time: 1 minute
Applied to: L+, C/Q, I/Q and L- lines through capacitive clamp
4.2.3
Test setup
The EFT signal was coupled to the supply voltage lines through the capacitive coupling
clamp which corresponds to approximately 150 pF.
The application supply voltage was provided by two 12 V lead battery cells.
Earth (reference plain) was connected to the application.
4.2.4
Conclusion
The application is immune against fast transient burst signals.
Burst applied to the IO-Link communication lines has no influence on the stability of the
L6360 internal registers.
4.3
EMC IEC 61000-4-5 surge immunity test
4.3.1
Test conditions
Supply voltage: 23 V (approximately)
Ambient temperature: 23 °C
L+, C/Q configured as mentioned in Table 6 to Table 8
Register values - see Section 4.1
L+, C/Q, I/Q lines left floating
Table 5.
Application EFT (burst) immunity, applied to IO-Link lines
(L+, C/Q, I/Q, L-)
Polarity
EFT test signal amplitude, test result
1 kV
2 kV
3 kV
4 kV
Positive (+)
A(1)
1.
The L6360 internal registers state stable; logic interface state changes not evaluated.
A(1)
A(1)
A(1)
Negative (-)
A(1)
A(1)
A(1)
A(1)



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