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AN3401 датащи(PDF) 11 Page - STMicroelectronics |
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AN3401 датащи(HTML) 11 Page - STMicroelectronics |
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11 / 18 page ![]() AN3401 Test results and device comparison Doc ID 018842 Rev 1 11/18 7 Test results and device comparison For every device and temperature condition an analysis has been done in terms of, power dissipation and junction temperature. 7.1 Free devices at ambient temperature For the average power the values are calculated using Equation 2. Figure 9. Power vs. Iak In the same condition the measured junction temperatures are: Figure 10. Junction temp. vs. Iak Schottky 20A Schottky 30A SPV1001 SPV1002 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 01234 56789 10 11 12 Pak (W) Iak (A) Power vs Iak Schottky 20A Schottky 30A SPV1001 SPV1002 0 20 40 60 80 100 120 0123456789 10 11 12 TEMP (C) Iak (A) Junction Temp vs Iak |
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