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AN2985 датащи(PDF) 12 Page - STMicroelectronics

номер детали AN2985
подробное описание детали  The STEVAL-IFP010V3 demonstration board has been developed
PDF  19 Pages
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производитель  STMICROELECTRONICS [STMicroelectronics]
домашняя страница  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

AN2985 датащи(HTML) 12 Page - STMicroelectronics

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EMC immunity tests
AN2985
12/19
Doc ID 15716 Rev 2
2
EMC immunity tests
The STEVAL-IFP010V3 has been tested according to EMC immunity standards
IEC61000-4-4 (fast transient burst) and IEC61000-4-5 (high energy surge).
A fast transient burst test has been performed all channels.
Each channel under test cycles on and off at 1 Hz, duty cycle 50%, on two 48
Ω load
resistors at 24 VDC supply voltage.
A burst signal was applied using an ultra-compact simulator with an internal capacitive
coupling clamp tool.
2.1
Test conditions
Ambient temperature: 25.5 °C
Ambient humidity: 46%
Mains voltage power supply: 24 Vdc
DC insulated voltage: 5 Vdc
Loads: 4 x 48
Ω power resistor
2.2
Burst immunity test
Table 3 shows the burst setup configuration used to perform this test.
Figure 13 shows the standard timing waveform applied during the burst test.
Table 3.
Burst setup configuration
Test level
Condition
Pulse time rt
5 ns ± 30%
Pulse duration td
50 ns ± 30%
Source impedance
Zq = 50
Ω ± 20%
Polarity
Positive / negative
Burst duration (td)
15 ms ± 20 % at
Burst frequency (f)5 kHz
Burst period (tr)
300 ms ± 20 %
Duration time (T)
5 min



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