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AN2684 датащи(PDF) 15 Page - STMicroelectronics |
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AN2684 датащи(HTML) 15 Page - STMicroelectronics |
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15 / 21 page ![]() AN2684 IFP006V1 demonstration board description Doc ID 14266 Rev 1 15/21 Table 5. Surge test results Surge standard test routines Level Voltage (V) Acceptance criteria (1) 1. Classification of the test (Criteria A): normal performance (Criteria B): temporary degradation or loss of function or performance with automatic return to normal operation (Criteria C): temporary degradation or loss of function with external intervention to recover normal operation (Criteria D): degradation or loss of function, need replacement of damaged components to recover normal operation. IEC 61000-4-5 Level 1 500 A IEC 61000-4-5 Level 2 1000 A IEC 61000-4-5 Level 3 2000 A |
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