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AN2208 датащи(PDF) 35 Page - STMicroelectronics

номер детали AN2208
подробное описание детали  Designing Industrial Applications with
PDF  51 Pages
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производитель  STMICROELECTRONICS [STMicroelectronics]
домашняя страница  http://www.st.com
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AN2208 датащи(HTML) 35 Page - STMicroelectronics

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AN2208
7 Test results
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7.1.3
EMC test results
IEC 61000-4-4 EFT test
The VN808 reference design board is tested according IEC 61000-4-4 for ±4kV level. Table 6
lists test results. Waveforms of bursts injected during the tests are shown in Figure 40 and
Figure 41.
The test lasted approximately 1 minute with ±4 kV and a repetition rate of 5 kHz. During the
tests, all channels were switched.
Test result: The VN808 HSD worked properly during the test.
IEC 61000-4-5 surge test
A coupling decoupling network with a 42
Ω impedance was used when performing the test. The
test was executed with ±2kV.
When testing power supply lines, all channels were switched. When testing the output channel,
only the tested channel was switched.
A 4.7nF 500V capacitor was placed between the power supply and the earth protection.
Table 6.
EMC test IEC 61000-4-4 EFT test results (VN808 RDB)
IEC 61000-4-4 Burst test
Test Condition
VN808 RDB 1/2
VN808 RDB 2/2
Power supply
Input ON
±4kV OK
±4kV OK
Input OFF
±4kV OK
±4kV OK
Switch @ 1Hz
±4kV OK
±4kV OK
Output
Input ON
±4kV OK
±4kV OK
Input OFF
±4kV OK
±4kV OK
Switch @ 1Hz
±4kV OK
±4kV OK
Input
Input ON
±4kV OK
±4kV OK
Input OFF
±4kV OK
±4kV OK
Figure 40. Burst applied on the power supply
Figure 41. Burst applied on the output channel



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