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AN1513 датащи(PDF) 11 Page - STMicroelectronics |
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AN1513 датащи(HTML) 11 Page - STMicroelectronics |
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11 / 13 page ![]() AN1513 Thermal test 11/13 7 Thermal test For system reliability it is important to keep device temperature at a safe level, considering the maximum ambient temperature especially when the board is inside a chassis. In Table 6 shows the temperatures measured on the SMPS after 4 hours of warm-up at full load at nominal input voltage 230Vac: the results are compatible with robust design rules. Figure 9. Transformer cross section Table 6. Thermal measurements Measure point Temperature (°C) Ambient 25 VIPer50A-E 47 STPS8H100F 53 STPS745 58 1.5KE220A 84 STTA106 55 DFO6M 52 T1 Ferrite 53 Table 7. Transformer specification and construction Parameter Value Primary inductance 670 µH ±8% 58 TURNS Winding output1 4 TURNS Winding output2 6 TURNS Auxiliary winding 6 TURNS Primary leakage inductance 12 µH 1.8% of Lp Core EPCOS ETD29-N67 Code B66358-G500-X67 |
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