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AN280 датащи(PDF) 13 Page - STMicroelectronics |
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AN280 датащи(HTML) 13 Page - STMicroelectronics |
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13 / 15 page ![]() AN280 Conclusion Doc ID 1703 Rev 3 13/15 5 Conclusion With the 0.2 µF bypass capacitor and the snubber circuit in place the voltage transients measured in the application have been limited to within safe values for the L6202. As shown in Figure 10 and Figure 11, the power supply voltage, the voltage across each of the DMOS transistors and the voltage across the output of the bridge (Vout1 - Vout2) are all within the maximum rating of the device with some margin. To insure reliable performance of an H-bridge drive circuit, the designer must insure that the device operates within the maximum ratings of the device(s) used in the circuit. One of the critical parameters to consider is the maximum voltage capability of the devices. To maintain the reliability, the voltage transients due to switching inductive loads must be maintained within the ratings of the device. Two techniques used to control the voltage transients in fast switching applications are proper bypass filtering of the power supply and snubbing the outputs to control voltage rise times. Using these two techniques the voltage transients in a DMOS bridge application can be controlled to within safe levels. |
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