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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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AN3213 датащи(PDF) 38 Page - STMicroelectronics |
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AN3213 датащи(HTML) 38 Page - STMicroelectronics |
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38 / 64 page  ST7570 demonstration board description AN3213 38/64 Doc ID 17429 Rev 1 Figure 32. Conducted emissions: transmission spectrum, quasi-peak measurement, 150 kHz - 30 MHz, neutral-to-earth, as per EN50065-1 7.2.2 Noise immunity The tests on immunity against white noise (AWGN) and narrow-band interferers (NBI) are based on two ST7570 demonstration boards, performing a unidirectional point-to-point communication. The first board transmits a message with a known bit pattern, while the receiving board passes the received message to the ST7570 GUI software, which calculates the percentage of wrong bits (BER). The tests have been performed at 1200 and 2400 baud. Figure 33 shows the test environment used to perform noise immunity tests. The noise (AWGN or NBI) is produced by a waveform generator and injected into the network through an AC coupling circuit; this circuit is mandatory to protect the waveform generator output. Figure 33. Noise immunity test setup |
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