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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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AN1714 датащи(PDF) 39 Page - STMicroelectronics |
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AN1714 датащи(HTML) 39 Page - STMicroelectronics |
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39 / 46 page  AN1714 Demonstration board characterization 39/46 Figure 32. Output signal spectrum, channel 132.5 kHz, mains 110 V~, random sequence Figure 33. Output signal spectrum, channel 110 kHz, mains 220 V~, random sequence 3.2 Narrowband conducted interference The setup of the narrowband conducted interferences test consists of a first transmitting demonstration board controlled by a BER (Bit Error Rate) tester that generates a random bit stream. The second board demodulates the received signal that is evaluated by the linked BER tester. The noise is produced by a waveform generator and injected into the artificial network by a coupling circuit connected to a low distortion power amplifier (EN50065-2-1, 7.2.3). Two types of signal noises have been used for the test: a pure sinusoidal signal and an amplitude-modulated signal, (modulating signal 1 kHz, modulation deep 80%). The amplitude of the noise signal is decreased until the BER measured is lower than 10-3 (one error every 1000 transmitted bits). The noise measure is done disconnecting the signal source and the coupling circuits from the artificial network. Ch 132.5 kHz, baud 2400, dev 0,5 - mains 110V~ Continuos Transmission - Random Sequences 20.0 30.0 40.0 50.0 60.0 70.0 80.0 90.0 100.0 110.0 120.0 10000 100000 1000000 10000000 100000000 dBuV EN50065-1 10kHz -> 150kHz (Bw = 100Hz) 150kHz -> 30MHz (Bw =10kHz) 2nd Harmonic 54.0dB µV 3rd Harmonic 47.2dB µV Ch 110 kHz, baud 2400, dev 0,5 Continuos Transmission - Random Sequences 20.0 30.0 40.0 50.0 60.0 70.0 80.0 90.0 100.0 110.0 120.0 10000 100000 1000000 10000000 100000000 dBuV EN50065-1 10kHz -> 150kHz (Bw = 100Hz) 150kHz -> 30MHz (Bw=10kHz) 2nd Harmonic 54.0dB µV 3rd Harmonic 47.2dB µV |
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