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SSD3055 датащи(PDF) 2 Page - SeCoS Halbleitertechnologie GmbH

номер детали SSD3055
подробное описание детали  N-Ch Enhancement Mode Power MOSFET
PDF  4 Pages
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производитель  SECOS [SeCoS Halbleitertechnologie GmbH]
домашняя страница  http://www.secosgmbh.com
Logo SECOS - SeCoS Halbleitertechnologie GmbH

SSD3055 датащи(HTML) 2 Page - SeCoS Halbleitertechnologie GmbH

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Elektronische Bauelemente
SSD3055
18A , 30V , RDS(ON) 22
N-Ch Enhancement Mode Power MOSFET
30-Apr-2012 Rev. B
Page 2 of 4
http://www.SeCoSGmbH.com/
Any changes of specification will not be informed individually.
ELECTRICAL CHARACTERISTICS (TJ=25°C unless otherwise specified)
Parameter
Symbol
Min.
Typ.
Max.
Unit
Teat Conditions
Static
Drain-Source Breakdown Voltage
BVDSS
30
-
-
V
VGS=0, ID= 250μA
Breakdown Voltage Temperature Coefficient △BVDSS /△TJ
-
0.023
-
V/°C
Reference to 25°C,
ID=1mA
Gate-Threshold Voltage
VGS(th)
1
-
2.5
V
VDS=VGS, ID=250μA
Forward Transconductance
gfs
-
21.6
-
S
VDS=5V, ID=15A
Gate-Source Leakage Current
IGSS
-
-
±100
nA
VGS= ±20V
TJ=25°C
-
-
1
VDS=24V, VGS=0
Drain-Source Leakage Current
TJ=55°C
IDSS
-
-
5
μA
VDS=24V, VGS=0
-
-
22
VGS=10V, ID=15A
Static Drain-Source On-Resistance
2
RDS(ON)
-
-
35
mΩ
VGS=4.5V, ID=10A
Total Gate Charge
2
Qg
-
6.2
-
Gate-Source Charge
Qgs
-
2.4
-
Gate-Drain (“Miller”) Change
Qgd
-
2.5
-
nC
ID=15A
VDS=15V
VGS=4.5V
Turn-on Delay Time
2
Td(on)
-
3
-
Rise Time
Tr
-
7.6
-
Turn-off Delay Time
Td(off)
-
21
-
Fall Time
Tf
-
4
-
nS
VDS=15V
ID=15A
VGS=10V
RG=3.3 Ω
RD=1.9 Ω
Input Capacitance
Ciss
-
572
-
Output Capacitance
Coss
-
81
-
Reverse Transfer Capacitance
Crss
-
65
-
pF
VGS =0
VDS=15V
f =1.0MHz
Guaranteed Avalanche Characteristics
Single Pulse Avalanche Energy
5
EAS
16
-
-
mJ
VDD=25V, L=0.1mH, IAS=10A
Source-Drain Diode
Diode Forward Voltage
2
VSD
-
-
1.2
V
IS=1A, VGS=0, TJ=25°C,
Continuous Source Current
1,6
IS
-
-
18
A
Pulsed Source Current
2,6
ISM
-
-
60
A
VD=VG=0, Force Current
Notes:
1. The data tested by surface mounted on a 1 inch2 FR-4 board with 2OZ copper.
2. The data tested by pulsed , pulse width ≦ 300μs , duty cycle ≦ 2%
3. The EAS data shows Max. rating . The test condition is VDD=25V,VGS=10V,L=0.1mH,IAS=17.8A
4. The power dissipation is limited by 150°C, junction temperature
5. The Min. value is 100% EAS tested guarantee.
6. The data is theoretically the same as ID and IDM , in real applications , should be limited by total power dissipation.



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