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SSD3055 датащи(PDF) 2 Page - SeCoS Halbleitertechnologie GmbH |
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SSD3055 датащи(HTML) 2 Page - SeCoS Halbleitertechnologie GmbH |
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2 / 4 page ![]() Elektronische Bauelemente SSD3055 18A , 30V , RDS(ON) 22Ω N-Ch Enhancement Mode Power MOSFET 30-Apr-2012 Rev. B Page 2 of 4 http://www.SeCoSGmbH.com/ Any changes of specification will not be informed individually. ELECTRICAL CHARACTERISTICS (TJ=25°C unless otherwise specified) Parameter Symbol Min. Typ. Max. Unit Teat Conditions Static Drain-Source Breakdown Voltage BVDSS 30 - - V VGS=0, ID= 250μA Breakdown Voltage Temperature Coefficient △BVDSS /△TJ - 0.023 - V/°C Reference to 25°C, ID=1mA Gate-Threshold Voltage VGS(th) 1 - 2.5 V VDS=VGS, ID=250μA Forward Transconductance gfs - 21.6 - S VDS=5V, ID=15A Gate-Source Leakage Current IGSS - - ±100 nA VGS= ±20V TJ=25°C - - 1 VDS=24V, VGS=0 Drain-Source Leakage Current TJ=55°C IDSS - - 5 μA VDS=24V, VGS=0 - - 22 VGS=10V, ID=15A Static Drain-Source On-Resistance 2 RDS(ON) - - 35 mΩ VGS=4.5V, ID=10A Total Gate Charge 2 Qg - 6.2 - Gate-Source Charge Qgs - 2.4 - Gate-Drain (“Miller”) Change Qgd - 2.5 - nC ID=15A VDS=15V VGS=4.5V Turn-on Delay Time 2 Td(on) - 3 - Rise Time Tr - 7.6 - Turn-off Delay Time Td(off) - 21 - Fall Time Tf - 4 - nS VDS=15V ID=15A VGS=10V RG=3.3 Ω RD=1.9 Ω Input Capacitance Ciss - 572 - Output Capacitance Coss - 81 - Reverse Transfer Capacitance Crss - 65 - pF VGS =0 VDS=15V f =1.0MHz Guaranteed Avalanche Characteristics Single Pulse Avalanche Energy 5 EAS 16 - - mJ VDD=25V, L=0.1mH, IAS=10A Source-Drain Diode Diode Forward Voltage 2 VSD - - 1.2 V IS=1A, VGS=0, TJ=25°C, Continuous Source Current 1,6 IS - - 18 A Pulsed Source Current 2,6 ISM - - 60 A VD=VG=0, Force Current Notes: 1. The data tested by surface mounted on a 1 inch2 FR-4 board with 2OZ copper. 2. The data tested by pulsed , pulse width ≦ 300μs , duty cycle ≦ 2% 3. The EAS data shows Max. rating . The test condition is VDD=25V,VGS=10V,L=0.1mH,IAS=17.8A 4. The power dissipation is limited by 150°C, junction temperature 5. The Min. value is 100% EAS tested guarantee. 6. The data is theoretically the same as ID and IDM , in real applications , should be limited by total power dissipation. |
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