7-449

Specifications CD4071BMS, CD4072BMS, CD4075BMS

Group B

Subgroup B-5

Sample 5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas

Subgroups 1, 2, 3, 9, 10, 11

Subgroup B-6

Sample 5005

1, 7, 9

Group D

Sample 5005

1, 2, 3, 8A, 8B, 9

Subgroups 1, 2 3

NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.

TABLE 7. TOTAL DOSE IRRADIATION

CONFORMANCE GROUPS

MIL-STD-883

METHOD

TEST

READ AND RECORD

PRE-IRRAD

POST-IRRAD

PRE-IRRAD

POST-IRRAD

Group E Subgroup 2

5005

1, 7, 9

Table 4

1, 9

Table 4

TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS

FUNCTION

OPEN

GROUND

VDD

9V

± -0.5V

OSCILLATOR

50kHz

25kHz

PART NUMBER CD4071BMS

Static Burn-In 1

Note 1

3, 4, 10, 11

1, 2, 5 - 9, 12 - 13

14

Static Burn-In 2

Note 1

3, 4, 10, 11

7

1, 2, 5, 6, 8, 9,

12 - 14

Dynamic Burn-

In Note 1

-

7

14

3, 4, 10, 11

1, 2, 5, 6, 8, 9, 12,

13

Irradiation

Note 2

3, 4, 10, 11

7

1, 2, 5, 6, 8, 9,

12 - 14

PART NUMBER CD4072BMS

Static Burn-In 1

Note 1

1, 6, 8, 13

2 - 5, 7, 9 - 12

14

Static Burn-In 2

Note 1

1, 6, 8, 13

7

2 - 5, 9 - 12, 14

Dynamic Burn-

In Note 1

6, 8

7

14

1, 13

2 - 5, 9 - 12

Irradiation

Note 2

1, 6, 8, 13

7

2 - 5, 9 - 12, 14

PART NUMBER CD4075BMS

Static Burn-In 1

Note 1

6, 9, 10

1 - 5, 7, 8, 11 - 13

14

Static Burn-In 2

Note 1

6, 9, 10

7

1 - 5, 8, 11 - 14

Dynamic Burn-

In Note 1

-

7

14

6, 9, 10

1 - 5, 8, 11 - 13

Irradiation

Note 2

6, 9, 10

7

1 - 5, 8, 11 - 14

NOTE:

1. Each pin except VDD and GND will have a series resistor of 10K

± 5%, VDD = 18V ± 0.5V

2. Each pin except VDD and GND will have a series resistor of 47K

± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,

VDD = 10V

± 0.5V

TABLE 6. APPLICABLE SUBGROUPS

(Continued)

CONFORMANCE GROUP

MIL-STD-883

METHOD

GROUP A SUBGROUPS

READ AND RECORD