ICS671-01

Zero Delay, Low Skew Buffer and Multipler

MDS 671-01 B

3

Revision 051700

Printed 11/15/00

Integrated Circuit Systems, Inc.• 525 Race Street • San Jose •CA•95126• (408) 295-9800 tel • www.icst.com

Parameter

Conditions

Minimum

Typical

Maximum

Units

ABSOLUTE MAXIMUM RATINGS (n

note 1)

Supply voltage, VDD

Referenced to GND

-0.5

7

V

Inputs and Clock Outputs

Referenced to GND

-0.5

VDD+0.5

V

Electrostatic Discharge

MIL-STD-883

2000

V

Ambient Operating Temperature

0

70

°C

Soldering Temperature

Max of 10 seconds

260

°C

Junction temperature

150

°C

Storage temperature

-65

150

°C

DC CHARACTERISTICS (VDD = 3.3 V unless specified ottherwise)

Operating Voltage, VDD

3.13

5.50

V

Input High Voltage, VIH, CLKIN pin only

VDD/2+1

VDD/2

V

Input Low Voltage, VIL, CLKIN pin only

VDD/2

VDD/2-1

V

Input High Voltage, VIH

2

V

Input Low Voltage, VIL

0.8

V

Output High Voltage, VOH

IOH=-25mA

2.4

V

Output Low Voltage, VOL

IOL=25mA

0.4

V

Output High Voltage, VOH, CMOS level

IOH=-8mA

VDD-0.4

V

Operating Suppl Current, IDD (Note 2)

No Load, S1=1, S0=0

25

mA

Operating Suppl Current, IDD (Note 3)

No Load, S1=1, S0=0

74

mA

Short Circuit Current

Each output

±50

mA

Input Capacitance

S0, S1, FBIN

7

pF

AC CHARACTERISTICS (VDD = 3.3 V unless specified oth

herwise)

Input Clock Frequency

See table on page 2

5

80

MHz

Output Clock Frequency

See table on page 2

5

160

MHz

Output Clock Rise Time, CL=30pF

0.8 to 2.0V

1.5

ns

Output Clock Fall Time, CL=30pF

2.0 to 0.8V

1.5

ns

Output Clock Duty Cycle, VDD=3.3V

At VDD/2

40

50

60

%

Device to Device Skew, equally loaded

rising edges at VDD/2

700

ps

Output to Output Skew, equally loaded

rising edges at VDD/2

250

ps

Input to Output Skew, FBIN to CLK8

rising edges at VDD/2

±350

ps

Maximum Absolute Jitter

300

ps

Cycle to Cycle Jitter, 30pF loads

500

ps

Electrical Specifications

Notes:

1. Stresses beyond those listed under Absolute Maximum Ratings could cause permanent damage to the device. Prolonged

exposure to levels above the operating limits but below the Absolute Maximums may affect device reliability.

2. With CLKIN = 20 MHz, FBIN to CLK8, all outputs at 40 MHz.

3. With CLKIN = 80 MHz, FBIN to CLK8, all outputs at 160 MHz.