4-54

AT-32011

AT-32033

Symbol

Parameters and Test Conditions

Units

Min.

Typ.

Max.

Min.

Typ.

Max.

NF

Noise Figure

f = 0.9 GHz

dB

Associated Gain

f = 0.9 GHz

dB

Forward Current Transfer Ratio

–

70

300

70

300

Collector Cutoff Current

µA

0.2

0.2

I

EBO

Emitter Cutoff Current

V

µA

1.5

1.5

Notes:

1. Test circuit A, Figure 1. Numbers reflect device performance de-embedded from circuit losses. Input loss = 0.3 dB;

output loss = 0.3 dB.

2. Test circuit B, Figure 1. Numbers reflect device performance de-embedded from circuit losses. Input loss = 0.3 dB;

output loss = 0.3 dB.

AT-32011, AT-32033 Absolute Maximum Ratings

Absolute

Symbol

Parameter

Units

Emitter-Base Voltage

V

1.5

Collector-Base Voltage

V

11

Collector-Emitter Voltage

V

5.5

Collector Current

mA

32

mW

200

Junction Temperature

°C

150

T

STG

Storage Temperature

°C

-65 to 150

θ

Notes:

1. Operation of this device above any one

of these parameters may cause permanent

damage.

3. Derate at 1.82 mW/

°C for T

1000 pF

VBB

W = 10 L = 1870

W = 10

CKT A: L = 380

CKT B: L = 380

W = 30

L = 60

W = 10 L = 1870

1000 pF

VCC

W = 10

CKT A: L = 105

CKT B: L = 850

CKT A: W = 30 L = 50 x 2

CKT B: W = 30 L = 60

TEST CIRCUIT

BOARD MATL = 0.062" FR-4 (

ε = 4.8)

RF IN

W = 30

L = 60

CKT A: 25

Ω

CKT B: 5

Ω

RF OUT

NOT TO SCALE

DIMENSIONS IN MILS

Figure 1. Test Circuit for Noise Figure and Associated Gain.

This circuit is a compromise match between best noise figure, best gain, stability, and a practical

synthesizable match.