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HAT2016R датащи(PDF) 3 Page - Hitachi Semiconductor |
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HAT2016R датащи(HTML) 3 Page - Hitachi Semiconductor |
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3 / 10 page ![]() HAT2016R 3 Electrical Characteristics (Ta = 25°C) Item Symbol Min Typ Max Unit Test Conditions Drain to source breakdown voltage V (BR)DSS 30 ——V I D = 10mA, VGS = 0 Gate to source breakdown voltage V (BR)GSS ±20 ——V I G = ±100µA, VDS = 0 Gate to source leak current I GSS —— ±10 µAV GS = ±16V, VDS = 0 Zero gate voltege drain current I DSS ——10 µAV DS = 30 V, VGS = 0 Gate to source cutoff voltage V GS(off) 1.0 — 2.0 V V DS = 10V, I D = 1mA Static drain to source on state R DS(on) — 0.03 0.045 Ω I D = 4A, VGS = 10V Note4 resistance R DS(on) — 0.05 0.08 Ω I D = 4A, VGS = 4V Note4 Forward transfer admittance |y fs| 58— S I D = 4A, VDS = 10V Note4 Input capacitance Ciss — 560 — pF V DS = 10V Output capacitance Coss — 380 — pF V GS = 0 Reverse transfer capacitance Crss — 170 — pF f = 1MHz Turn-on delay time t d(on) — 30 — ns V GS = 4V, ID = 4A Rise time t r — 270 — ns V DD ≅ 10V Turn-off delay time t d(off) —40 — ns Fall time t f —65 — ns Body–drain diode forward voltage V DF — 0.9 1.4 V IF = 6.5A, V GS = 0 Note4 Body–drain diode reverse recovery time t rr — 45 — ns IF = 6.5A, V GS = 0 diF/ dt =20A/ µs Note: 4. Pulse test |
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