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HAF2011L датащи(PDF) 3 Page - Hitachi Semiconductor |
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HAF2011L датащи(HTML) 3 Page - Hitachi Semiconductor |
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3 / 6 page ![]() HAF2011(L),HAF2011(S) 3 Electrical Characteristics (Ta = 25 °C) Item Symbol Min Typ Max Unit Test Conditions Drain current I D1 (25) — — A V GS = 3.5V, VDS = 2V Drain current I D2 — — 10 mA V GS = 1.2V, VDS = 2V Drain to source breakdown voltage V (BR)DSS 60 ——V I D = 10mA, VGS = 0 Gate to source breakdown voltage V (BR)GSS (16) — — V I G = (300µA), VDS = 0 Gate to source breakdown voltage V (BR)GSS (–2.5) — — V I G = (–100µA), VDS = 0 Gate to source leak current I GSS1 — — 100 µAV GS = 8V, VDS = 0 I GSS2 —— 50 µAV GS = 3.5V, VDS = 0 I GSS3 —— 1 µAV GS = 1.2V, VDS = 0 I GSS4 — — –100 µAV GS = –2.4V, VDS = 0 Input current (shut down) I GS(op)1 — 0.8 — mA V GS = 8V, VDS = 0 I GS(op)2 — 0.35 — mA V GS = 3.5V, VDS = 0 Zero gate voltege drain current I DSS — — 250 µAV DS = 50 V, VGS = 0 Gate to source cutoff voltage V GS(off) 1.0 — 2.25 V I D = 1mA, VDS = 10V Static drain to source on state resistance R DS(on) —2533m Ω I D = 20A, VGS = 4V Note3 Static drain to source on state resistance R DS(on) —1520m Ω I D = 20A, VGS = 10V Note3 Forward transfer admittance |y fs|25 50 — S I D = 20A, VDS = 10V Note3 Output capacitance Coss — 940 — pF V DS = 10V , VGS = 0 f = 1 MHz Turn-on delay time t d(on) — (7.8) — µsI D = 5A, VGS = 5V Rise time t r — (64) — µsR L = 6Ω Turn-off delay time t d(off) — (19) — µs Fall time t f — (30) — µs Body–drain diode forward voltage V DF — (0.85) — V I F = 40A, VGS = 0 Body–drain diode reverse recovery time t rr — ( ) — ns I F = 40A, VGS = 0 diF/ dt =50A/ µs Over load shut down t os1 — ( ) — ms V GS = 5V, VDD = 12V operation time Note4 t os2 — ( ) — ms V GS = 5V, VDD = 24V Note: 3. Pulse test 4. Include the time shiff based on increasing of chennel temperature when operete under over load condition. |
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