ADS5542IPAPR datasheet(3/33 Pages) TI1

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RECOMMENDED OPERATING CONDITIONS

ELECTRICAL CHARACTERISTICS

ADS5542

SBAS308D – MAY 2004 – REVISED FEBRUARY 2007

MIN

TYP

MAX

UNIT

SUPPLIES

Analog supply voltage, AVDD

3.3

3.6

Output driver supply voltage, DRVDD

3.3

3.6

ANALOG INPUT

Differential input range

2.3

VPP

Input common-mode voltage, VCM(1)

1.45

1.55

1.65

DIGITAL OUTPUT

Maximum output load

CLOCK INPUT

ADCLK input sample rate (sine wave) 1/tC

MSPS

Clock amplitude, sine wave, differential(2)

VPP

Clock duty cycle(3)

50%

Open free-air temperature range

–40

°C

(1)

Input common-mode should be connected to CM.

(2)

See Figure 47 for more information.

(3)

See Figure 46 for more information.

Typical values given at T

A = 25°C, min and max specified over the full recommended operating temperature range, AVDD =

DRV

DD = 3.3 V, sampling rate = 80 MSPS, 50% clock duty cycle, 3-VPP differential clock, and –1dBFS differential input,

unless otherwise noted

PARAMETER

CONDITIONS

MIN

TYP

MAX

UNIT

Resolution

Bits

Analog Inputs

Differential input range

2.3

VPP

Differential input impedance

See Figure 37

6.6

Ω

Differential input capacitance

See Figure 37

Analog input common-mode current (per

200

µA

input)

Analog input bandwidth

Source impedance = 50

Ω

750

MHz

Voltage overload recovery time

Clock cycles

Internal Reference Voltages

Reference bottom voltage, VREFM

1.0

Reference top voltage, VREFP

2.15

Reference error

–4%

±0.6%

Common-mode voltage output, VCM

1.55

±0.05

Dynamic DC Characteristics and Accuracy

No missing codes

Assured

Differential nonlinearity error, DNL

fIN = 10 MHz

-0.9

0.5

1.1

LSB

Integral nonlinearity error, INL

fIN = 10 MHz

–5

±2

LSB

Offset error

-11

±1.5

Offset temperature coefficient

0.02

mV/

°C

∆offset error/∆AV

DD from AVDD = 3 V to

DC power-supply rejection ratio, DC PSRR

0.25

mV/V

AVDD = 3.6 V

Gain error (1)

-2

0.3

%FS

Gain temperature coefficient

–0.02

∆%/°C

(1)

Gain error is specified by design and characterization; it is not tested in production.

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