54HSC/T630

9/10

RADIATION TOLERANCE

Total Dose Radiation Testing

For product procured to guaranteed total dose radiation

levels, each wafer lot will be approved when all sample

devices from each lot pass the total dose radiation test.

The sample devices will be subjected to the total dose

radiation level (Cobalt-60 Source), defined by the ordering

code, and must continue to meet the electrical parameters

specified in the data sheet. Electrical tests, pre and post

irradiation, will be read and recorded.

GEC Plessey Semiconductors can provide radiation

testing compliant with Mil-Std-883 method 1019 Ionizing

Radiation (total dose) test.

ORDERING INFORMATION

For details of reliability, QA/QC, test and assembly

options, see ‘Manufacturing Capability and Quality

Assurance Standards’ Section 9.

Unique Circuit Designator

‘Blank’

R

Q

H *

No tolerance implied

100 kRads (Si) Guaranteed

300 kRads (Si) Guaranteed

1000 kRads (Si) Guaranteed

*HSC Only

Radiation Tolerance

C

F

Ceramic DIL (Solder Seal)

Flatpack (Solder Seal)

Package Type

QA/QCI Process

(See Section 9 Part 4)

Test Process

(See Section 9 Part 3)

Assembly Process

(See Section 9 Part 2)

L

C

D

E

B

S

Rel 0

Rel 1

Rel 2

Rel 3/4/5/STACK

Class B

Class S

Reliability Level

54xHSC/T630xxxxx

Total Dose (Function to specification)*

3x10

Transient Upset (Stored data loss)

5x10

Transient Upset (Survivability)

>1x10

Neutron Hardness (Function to specification)

>1x10

Single Event Upset**

<1x10

Latch Up

Not possible

* Other total dose radiation levels available on request

** Worst case galactic cosmic ray upset - interplanetary/high altitude orbit

Figure 11: Radiation Hardness Parameters