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CAT93C6621 датащи(PDF) 3 Page - Catalyst Semiconductor

номер детали CAT93C6621
подробное описание детали  Supervisory Circuits with Microwire Serial CMOS E2PROM, Precision Reset Controller and Watchdog Timer
PDF  10 Pages
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производитель  CATALYST [Catalyst Semiconductor]
домашняя страница  http://www.catalyst-semiconductor.com
Logo CATALYST - Catalyst Semiconductor

CAT93C6621 датащи(HTML) 3 Page - Catalyst Semiconductor

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9-87
CAT93CXXXX
Stock No. 21084-01 2/98
Advanced Information
A.C. CHARACTERISTICS
VCC=2.7V to 6.0V unless otherwise specified.
Output Load is 1 TTL Gate and 100pF
Power-Up Timing(1)(2)
Symbol
Parameter
Max.
Units
tPUR
Power-up to Read Operation
1
ms
tPUW
Power-up to Write Operation
1
ms
Note:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
(2) tPUR and tPUW are the delays required from the time VCC is stable until the specified operation can be initiated.
(3) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to VCC +1V.
Limits
VCC =VCC =
2.7V -6V
4.5V-5.5V
Test
SYMBOL PARAMETER
Min.
Max.
Min.
Max.
UNITS Conditions
tCSS
CS Setup Time
250
50
ns
tCSH
CS Hold Time
0
0
ns
tDIS
DI Setup Time
250
50
ns
tDIH
DI Hold Time
250
50
ns
tPD1
Output Delay to 1
0.5
0.1
µs
tPD0
Output Delay to 0
0.5
0.1
µs
tHZ(1)
Output Delay to High-Z
500
100
ns
tEW
Program/Erase Pulse Width
5
5
ms
tCSMIN
Minimum CS Low Time
0.5
0.1
µs
tSKHI
Minimum SK High Time
0.5
0.1
µs
tSKLOW
Minimum SK Low Time
0.5
0.1
µs
tSV
Output Delay to Status Valid
0.5
0.1
µs
SKMAX
Maximum Clock Frequency
DC
1000
DC
3000
KHZ
CL = 100pF
CAPACITANCE TA = 25°C, f = 1.0 MHz, VCC = 5V
Symbol
Test
Max.
Units
Conditions
CI/O(1)
Input/Output Capacitance
8
pF
VI/O = 0V
CIN(1)
Input Capacitance
6
pF
VIN = 0V
RELIABILITY CHARACTERISTICS
Symbol
Parameter
Min.
Max.
Units
Reference Test Method
NEND(1)
Endurance
1,000,000
Cycles/Byte
MIL-STD-883, Test Method 1033
TDR(1)
Data Retention
100
Years
MIL-STD-883, Test Method 1008
VZAP(1)
ESD Susceptibility
2000
Volts
MIL-STD-883, Test Method 3015
ILTH(1)(3)
Latch-up
100
mA
JEDEC Standard 17



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