OPA314

OPA2314

OPA4314

SBOS563F – MAY 2011 – REVISED AUGUST 2013

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

PRODUCT

PACKAGE-LEAD

PACKAGE DESIGNATOR

PACKAGE MARKING

SC70-5

DCK

SAA

OPA314

SOT23-5

DBV

RAZ

SO-8

D

O2314

OPA2314

MSOP-8

DGK

OCPQ

DFN-8

DRB

QXY

OPA4314

TSSOP-14

PW

OPA4314

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the

device product folder at www.ti.com.

ABSOLUTE MAXIMUM RATINGS

(1)

Over operating free-air temperature range, unless otherwise noted.

OPA314, OPA2314, OPA4314

UNIT

Supply voltage

7

V

(V–) – 0.5 to (V+) + 0.5

V

Signal input terminals

±10

mA

Continuous

mA

–40 to +150

°C

–65 to +150

°C

+150

°C

Human body model (HBM)

4000

V

ESD rating

Charged device model (CDM)

1000

V

Machine model (MM)

200

V

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not supported.

(2)

Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5 V beyond the supply rails should

be current limited to 10 mA or less.

(3)

Short-circuit to ground, one amplifier per package.

2

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Product Folder Links: OPA314 OPA2314 OPA4314