TSL2672 datasheet(6/31 Pages) AMSCO

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TSL2672

DIGITAL PROXIMITY DETECTOR

TAOS133 − MAY 2012

The LUMENOLOGY

r Company

E 2012, TAOS Inc.

www.taosinc.com

Proximity Characteristics, VDD = 3 V, TA = 255C, PGAIN = 1y, PEN = 1 (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

IDD

Supply current

LDR pulse on

ADC conversion time step size

PTIME = 0xFF

2.58

2.73

2.9

ADC number of integration steps

(Note 1)

256

steps

ADC counts per step (Note 1)

PTIME = 0xFF

1023

counts

ADC count value

λp = 850 nm, Ee = 263.4 μW/cm2,

CH0 diode

1500

2000

2500

counts

ADC count value

λp = 850 nm, Ee = 263.4 μW/cm ,

PTIME = 0xFB, PPULSE = 4

CH1 diode

900

1200

1500

counts

ADC output responsivity

850 nm PTIME

0xFB PPULSE

CH0 diode

1.90

counts/

ADC output responsivity

λp = 850 nm, PTIME = 0xFB, PPULSE = 1

CH1 diode

1.14

counts/

μW/cm2

lti

t 1

× i

PGAIN = 2

Gain scaling, relative to 1

× gain

PGAIN

Gain scaling, relative to 1

× gain

setting

PGAIN = 4

setting

PGAIN = 8

Noise (Notes 1 2 3)

Ee = 0, PTIME = 0xFB, PPULSE = 4

CH0 diode

0.5

%FS

Noise (Notes 1, 2, 3)

Ee = 0, PTIME = 0xFB, PPULSE = 4

(Note 6)

CH1 diode

0.5

% FS

LED pulse count (Note 1)

255

pulses

LED pulse period

16.0

μs

LED pulse width — LED on time

7.3

μs

120 mA: PDRIVE = 0 & PDL = 0

116

145

60 mA: PDRIVE = 1 & PDL = 0

30 mA: PDRIVE = 2 & PDL = 0

LED drive current

ISINK sink current @

15 mA: PDRIVE = 3 & PDL = 0

14.5

LED drive current

ISINK sink current @

1.6 V, LDR pin

15 mA: PDRIVE = 0 & PDL = 1

12.9

7.5 mA: PDRIVE = 1 & PDL = 1

6.4

3.8 mA: PDRIVE = 2 & PDL = 1

3.2

1.9 mA: PDRIVE = 3 & PDL = 1

1.6

Maximum operating distance

(Notes 1, 4, 5)

PDRIVE = 0 and PDL = 0 (116 mA), PPULSE = 64

Emitter:

λp = 850 nm, 20° half angle, and 60 mW/sr

Object: 16

× 20-inch, 90% reflective Kodak Gray Card

(white surface)

Optics: Open view (no glass, no optical attenuation)

inches

NOTES: 1. Parameter is ensured by design or characterization and is not tested.

2. Proximity noise is defined as one standard deviation of 600 samples.

3. Proximity noise typically increases as

√PPULSE

4. Greater operating distances are achievable with appropriate optical system design considerations. See available TAOS application

notes for additional information.

5. Maximum operating distance is dependent upon emitter and the reflective properties of the object’s surface.

6. Proximity noise test was done using the following circuit:

TSL2672

VDD

15.0

VDD

GND

LDR

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