 |
поискавой системы для электроныых деталей |
|
|
поискавой системы для электроныых деталей |
|
TNETE100PMPGE датащи(PDF) 17 Page - Texas Instruments |
|
|
|||||||||||||||||||||||||||||
TNETE100PMPGE датащи(HTML) 17 Page - Texas Instruments |
|
|
17 / 26 page  ThunderLAN ™ TNETE100 PCI ETHERNET ™ CONTROLLER SINGLE-CHIP 10 BASE-T WITH MII FOR 100 BASE-T/100VG-AnyLAN ™ SPWS017B – APRIL 1995 – REVISED AUGUST 1996 17 POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251–1443 (c) FIREF TEST CIRCUIT (b) AXMTP AND AXMTN TEST LOAD (AC TESTING) X1 – Fil – Mag 23Z90 (1:1) (a) TTL OUTPUT TEST LOAD 180 Ω FIREF AXMTN AXMTP 78 Ω Point Test CL IOH VLOAD IOL Point Test Test Under Output TTL 50 Ω FXMTN FXMTP X1 50 Ω 50 Ω Point Test 50 Ω X2 50 Ω 50 Ω 25 Ω 25 Ω FXMTN FXMTP Point Test 50 Ω 50 Ω 50 Ω 50 Ω Point Test (e) FXMTP AND FXMTN TEST LOAD (DC TESTING) (d) FXMTP AND FXMTN TEST LOAD (AC TESTING) X2 – Fil – Mag 23Z128 (1: √2) Where: IOL = Refer to IOL in recommended operating conditions IOH = Refer to IOH in recommended operating conditions VLOAD = 1.5 V, typical dc-level verification or 0.7 V, typical timing verification CL = 18 pF, typical load-circuit capacitance Figure 3. Test and Load Circuit |
|
|
ссылки URL |
| Вашему бизинису помогли Аллдатащит? [ DONATE ] |
Что такое Аллдатащит | реклама | контакт | Конфиденциальность | Ссылка на техническое описание | обмен ссыками | поиск по производителю All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |
Russian ▼
English
Chinese
German
Japanese
Russian
Korean
Spanish
French
Italian
Portuguese
Polish
Vietnamese
Indian
Mexican
British
New Zealand
