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AM29F100B-120DPC датащи(PDF) 6 Page - Advanced Micro Devices

номер детали AM29F100B-120DPC
подробное описание детали  1 Megabit (128 K x 8-Bit/64 K x 16-Bit) CMOS 5.0 Volt-only, Boot Sector Flash Memory-Die Revision 1
PDF  8 Pages
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производитель  AMD [Advanced Micro Devices]
домашняя страница  http://www.amd.com
Logo AMD - Advanced Micro Devices

AM29F100B-120DPC датащи(HTML) 6 Page - Advanced Micro Devices

  AM29F100B-120DPC Datasheet HTML 1Page - Advanced Micro Devices AM29F100B-120DPC Datasheet HTML 2Page - Advanced Micro Devices AM29F100B-120DPC Datasheet HTML 3Page - Advanced Micro Devices AM29F100B-120DPC Datasheet HTML 4Page - Advanced Micro Devices AM29F100B-120DPC Datasheet HTML 5Page - Advanced Micro Devices AM29F100B-120DPC Datasheet HTML 6Page - Advanced Micro Devices AM29F100B-120DPC Datasheet HTML 7Page - Advanced Micro Devices AM29F100B-120DPC Datasheet HTML 8Page - Advanced Micro Devices  
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6
Am29F100 Known Good Die
SU PP L E ME NT
PRODUCT TEST FLOW
Figure 1 provides an overview of AMD’s Known Good
Die test flow. For more detailed information, refer to the
Am29F100 product qualification database supplement
for KGD. AMD implements quality assurance proce-
dures throughout the product test flow. In addition, an
off-line quality monitoring program (QMP) further guar-
antees AMD quality standards are met on Known Good
Die products. These QA procedures also allow AMD to
produce KGD products without requiring or imple-
menting burn-in.
Figure 1.
AMD KGD Product Test Flow
Wafer Sort 1
Bake
24 hours at 250
°C
Wafer Sort 2
Wafer Sort 3
High Temperature
Packaging for Shipment
Shipment
DC Parameters
Functionality
Programmability
Erasability
Data Retention
DC Parameters
Functionality
Programmability
Erasability
DC Parameters
Functionality
Programmability
Erasability
Speed
Incoming Inspection
Wafer Saw
Die Separation
100% Visual Inspection
Die Pack



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