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AM29F016B датащи(PDF) 24 Page - Advanced Micro Devices |
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AM29F016B датащи(HTML) 24 Page - Advanced Micro Devices |
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24 / 38 page ![]() 24 Am29F016B P R E L I M I NARY TEST CONDITIONS Table 7. Test Specifications KEY TO SWITCHING WAVEFORMS 2.7 k Ω CL 6.2 k Ω 5.0 V Device Under Test 21444B-15 Figure 8. Test Setup Note: Diodes are IN3064 or equivalent Test Condition All speed options Unit Output Load 1 TTL gate Output Load Capacitance, CL (including jig capacitance) 100 pF Input Rise and Fall Times 20 ns Input Pulse Levels 0.45–2.4 V Input timing measurement reference levels 0.8 V Output timing measurement reference levels 2.0 V KS000010-PAL WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) |
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