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LM77 датащи(PDF) 5 Page - Texas Instruments

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номер детали LM77
подробное описание детали  LM77 9-Bit Sign Digital Temperature Sensor and Thermal Window Comparator ith Two-Wire Interface
PDF  23 Pages
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производитель  TI [Texas Instruments]
домашняя страница  http://www.ti.com
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LM77 датащи(HTML) 5 Page - Texas Instruments

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LM77
www.ti.com
SNIS103F – JUNE 1999 – REVISED MARCH 2013
Logic Electrical Characteristics Digital DC Characteristics (continued)
Unless otherwise noted, these specifications apply for +VS=+5 Vdc ±10% for LM77CIM-5, LM77CIMM-5 and +VS=+3.3 Vdc
±10% for LM77CIM-3, LM77CIMM-3. Boldface limits apply for TA = TJ = TMIN to TMAX; all other limits TA= TJ=+25°C, unless
otherwise noted.
Units
Parameter
Test Conditions
Typical(1)
Limits(2)
(Limit)
VOL
Low Level Output Voltage
IOL = 3 mA
0.4
V (max)
T_CRIT_A Output Saturation Voltage
IOUT = 4.0 mA
(3)
0.8
V (max)
T_CRIT_A Delay
1
Conversions
(max)
tOF
Output Fall Time
CL = 400 pF
250
ns (max)
IO = 3 mA
(3)
For best accuracy, minimize output loading. Higher sink currents can affect sensor accuracy with internal heating. This can cause an
error of 0.64°C at full rated sink current and saturation voltage based on junction-to-ambient thermal resistance.
Logic Electrical Characteristics Serial Bus Digital Switching Characteristics
Unless otherwise noted, these specifications apply for +VS=+5 Vdc ±10% for LM77CIM-5 and LM77CIMM-5, +VS=+3.3 Vdc
±10% for LM77CIM-3 and LM77CIMM-3, CL (load capacitance) on output lines = 80 pF unless otherwise specified. Boldface
limits apply for TA = TJ = TMIN to TMAX; all other limits TA = TJ = +25°C, unless otherwise noted.
Units
Parameter
Test Conditions
Typical(1)
Limits(2)(3)
(Limit)
t1
SCL (Clock) Period
2.5
μs(min)
t2
Data in Set-Up Time to SCL High
100
ns(min)
t3
Data Out Stable after SCL Low
0
ns(min)
t4
SDA Low Set-Up Time to SCL Low (Start Condition)
100
ns(min)
t5
SDA High Hold Time after SCL High (Stop Condition)
100
ns(min)
(1)
Typicals are at TA = 25°C and represent most likely parametric norm.
(2)
Limits are guaranteed to TI's AOQL (Average Outgoing Quality Level).
(3)
Timing specifications are tested at the bus input logic levels (Vin(0)=0.3xVA for a falling edge and Vin(1)=0.7xVA for a rising edge) when
the SCL and SDA edge rates are similar.
Figure 4.
Copyright © 1999–2013, Texas Instruments Incorporated
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