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TC253SPD датащи(PDF) 5 Page - Texas Instruments

номер детали TC253SPD
подробное описание детали  680 X 500 PIXEL CCD IMAGE SENSOR
PDF  19 Pages
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производитель  TI [Texas Instruments]
домашняя страница  http://www.ti.com
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TC253SPD датащи(HTML) 5 Page - Texas Instruments

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TC253SPD
680×500 PIXEL CCD IMAGE SENSOR
SOCS062B – JANUARY 2001 – REVISED MAY 2002
5
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
Terminal Functions
TERMINAL
I/O
DESCRIPTION
NAME
NO.
I/O
DESCRIPTION
ADB
9
I
Supply voltage for amplifiers and clearing drain
CMG
6
I
Charge multiplication gate
IAG1
12
I
Image area gate 1
IAG2
2
I
Image area gate 2
NC
8
–
No connection
ODB
1
I
Supply voltage for antiblooming drain
VOUT
7
O
Output signal, multiplier channel
SAG1
11
I
Storage area gate 1
SAG2
3
I
Storage area gate 2
SRG1
4
I
Serial register gate 1
SRG2
5
I
Serial register gate 2
SUB
10
Chip substrate
detailed description
The TC253SPD sensor consists of four basic functional blocks: the image-sensing area, the image storage
area, the serial register, and the charge multiplier. The location of each of these blocks is identified in the
functional block diagram.
image-sensing and storage areas
Figure 1 and Figure 2 show cross sections with potential-well diagrams and top views of the pixels in the
image-sensing and storage areas. As light enters silicon in the image-sensing area, electrons are generated
and collected in potential wells of the pixels. Applying a suitable dc bias to the antiblooming drain provides
blooming protection. Electrons that exceed a specified level, determined by the ODB bias, are drained away
from the pixels. If it is necessary to remove all previously accumulated charge from the wells, a short positive
pulse must be applied to the drain. This marks the beginning of the new integration period. After the integration
cycle is completed, charge is quickly transferred into the memory where it waits for readout. The lines can be
read out from the memory in a sequential order to implement progressive scan, or two lines can be summed
together to implement the pseudo-interlace scan.
Twenty-two columns at the left edge of the image-sensing area are shielded from incident light. These pixels
provide the dark reference used in subsequent video-processing circuits to restore the video black level. An
additional four dark lines located between the image-sensing area and the image storage area were added for
isolation.



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