LMP7300MA datasheet(3/17 Pages) TI

3 / 17 page

LMP7300

www.ti.com

SNOSAT7F – AUGUST 2007 – REVISED MARCH 2013

2.7V Electrical Characteristics

(1)

Unless otherwise specified, all limits are ensured for TA = 25°C, V

+ = 2.7V, V− = 0V, and V

CM = V

+/2, R

PULLUP = 100 kΩ, CLOAD

= 10 pF. Boldface limits apply at the temperature extremes.

Symbol

Parameter

Conditions

Min(2)

Typ(3)

Max(2)

Units

Supply Current

RPULLUP = Open

μA

Comparator

±0.75

VCM = V

+/2 SOIC

±0.07

±2

VOS

Input Offset Voltage

±1.0

VCM = V

+/2 VSSOP

±0.07

±2.2

TCVOS

Input Offset Average Drift

See(4)

1.8

μV/°C

Input Bias Current(5)

|VID| < 2.5V

1.2

IOS

Input Offset Current

0.15

0.5

CMRR

Common Mode Rejection Ratio

1V < VCM < 2.7V

100

PSRR

Power Supply Rejection Ratio

V+ = 2.7V to 12V

100

0.4

VOL

Output Low Voltage

ILOAD = 10 mA

0.25

0.5

ILEAK

Output Leakage Current

Comparator Output in High State

0 < Ref-HYSTP,N < 25 mV

1.000

Hysteresis Control Voltage

HCLIN

mV/V

Linearity

25 mV < Ref-HYSTP,N < 100 mV

0.950

IHYS

Hysteresis Leakage Current

1.2

Overdrive = 10 mV, CL = 10 pF

Propagation Delay

TPD

μs

(High to Low)

Overdrive = 100 mV, CL = 10 pF

4.5

7.6

Reference

SOIC

2.043

2.048

2.053

Reference Voltage

VSSOP

2.043

2.048

2.056

Line Regulation

VCC = 2.7V to 12V

μV/V

Load Regulation

IOUT = 0 to 1 mA

0.2

0.5

mV/mA

TCVREF/°C Temperature Coefficient

−40°C to 125°C

ppm/°C

0.1 Hz to 10 Hz

μVPP

Output Noise Voltage

10 Hz to 10 kHz

100

μVRMS

(1)

Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very

limited self-heating of the device such that TJ = TA. No ensured specification of parametric performance is indicated in the electrical

tables under conditions of internal self-heating where TJ > TA.

(2)

Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using

statistical quality control (SQC) method.

(3)

Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped

production material.

(4)

Offset voltage average drift determined by dividing the change in VOS at temperature extremes, by the total temperature change.

(5)

Positive current corresponds to current flowing into the device.

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