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CopperWire датащи(PDF) 18 Page - Freescale Semiconductor, Inc

номер детали CopperWire
подробное описание детали  RF Power Field Effect Transistor N--Channel Enhancement--Mode Lateral MOSFET
PDF  19 Pages
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производитель  FREESCALE [Freescale Semiconductor, Inc]
домашняя страница  http://www.freescale.com
Logo FREESCALE - Freescale Semiconductor, Inc

CopperWire датащи(HTML) 18 Page - Freescale Semiconductor, Inc

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RF Device Data
Freescale Semiconductor
MRF6VP2600HR6
PRODUCT DOCUMENTATION AND SOFTWARE
Refer to the following documents to aid your design process.
Application Notes
• AN1955: Thermal Measurement Methodology of RF Power Amplifiers
Engineering Bulletins
• EB212: Using Data Sheet Impedances for RF LDMOS Devices
Software
• Electromigration MTTF Calculator
• RF High Power Model
For Software, do a Part Number search at http://www.freescale.com, and select the “Part Number” link. Go to the Software &
Tools tab on the part’s Product Summary page to download the respective tool.
REVISION HISTORY
The following table summarizes revisions to this document.
Revision
Date
Description
0
Mar. 2008
• Initial Release of Data Sheet
1
July 2008
• Removed Capable of Handling 5:1 VSWR bullet, p. 1
• Corrected Zsource and Zload values from 1.58 + j6.47 to 1.42 + j8.09 and 4.60 + j1.85 to 4.45 + j1.16 and re-
plotted data in Fig. 21, Series Equivalent Source and Load Impedance, p. 9
2
Sept. 2008 • Added Note to Fig. 4, Capacitance versus Drain--Source Voltage and Fig. 5, DC Safe Operating Area to de-
note that each side of device is measured separately, p. 5
• Updated Fig. 5, DC Safe Operating Area, to show one side of the device, p. 5
• Figs. 21 and 27, Series Equivalent Source and Load Impedance, corrected Zsource copy to read “Test circuit
impedance as measured from gate to gate, balanced configuration” and Zload copy to read “Test circuit
impedance as measured from gate to gate, balanced configuration”, p. 9, 14
2.1
Nov. 2008
• Corrected Figs. 21 and 27 Revision History Zload copy to read ”Test circuit impedance as measured from
drain to drain, balanced configuration”, p. 9, 14
4
May 2009
• Updated bullets in Features section to reflect consistent listing across products, p. 1
• Added thermal data for 352.2 MHz application to Table 2, Thermal Characteristics, p. 1
• Added Typical Performances table for 352.2 MHz application, p. 2
• Added Fig. 28, Test Circuit Component Layout -- 352.2 MHz and Table 7, Test Circuit Component Designations
and Values -- 352.2 MHz, p. 15
• Added Fig. 29, CW Power Gain and Drain Efficiency versus Output Power -- 352.2 MHz p. 16
• Added Fig. 30, Series Equivalent Source and Load Impedance -- 352.2 MHz, p. 17
4.1
June 2009
• Changed “EKME630ELL471MK25S” part number to “MCGPR63V477M13X26--RH”, Table 5, Test Circuit
Component Designations and Values and Table 6, Test Circuit Component Designations and Values —
88--108 MHz, p. 3, 11
• Added Electromigration MTTF Calculator and RF High Power Model availability to Product Documentation,
Tools and Software, p. 20
5
May 2010
• Changed 10--500 MHz to 2--500 MHz in Device Description box, p. 1
• Operating Junction Temperature increased from 200°C to 225°C in Maximum Ratings table and related
“Continuous use at maximum temperature will affect MTTF” footnote added, p. 1
• Added thermal data for 88--108 MHz application to Thermal Characteristics table, p. 1
• Added Typical Performance table for 88--108 MHz application, p. 2
• Removed Fig. 20, MTTF versus Junction Temperature -- Pulsed and renumbered accordingly, p. 8
• Replaced Fig. 22 Test Circuit Component Layout, Table 6. Test Circuit Component Designations and Values,
the Typical Characteristic curves and Fig. 27 Series Impedance for 88--108 MHz with improved circuit
performance figures. The 88--108 MHz application circuit is also now a more compact size., p. 10--12
5.1
July 2010
• Fig. 24, Series Impedance for 88--108 MHz, table and plot updated to reflect correct location of Zsource and
Zload,p.12



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