STM8T143AM62T datasheet(45/65 Pages) STMICROELECTRONICS

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STM8T143

Electrical characteristics

9.7

EMC characteristics

Susceptibility and emission tests are performed on a sample basis during product

characterization.

Both the sample and its applicative hardware environment are mounted on a dedicated

specific EMC board defined in the IEC61967-1 standard.

9.7.1

Functional EMS (electromagnetic susceptibility)

While running in the above described environment the product is stressed by two

electromagnetic events until a failure occurs.

•

ESD: Electrostatic discharge (positive and negative) is applied on all pins of the device

until a functional disturbance occurs. This test complies with the IEC 1000-4-2

standard.

•

FTB: A burst of fast transient voltage (positive and negative) is applied to VDD and VSS

through a 100 pF capacitor, until a functional disturbance occurs. This test complies

with the IEC 1000-4-4 standard.

A device reset allows normal operations to be resumed. The test results are given in

Table 21 based on the EMS levels and classes defined in application note AN1709.

9.7.2

Prequalification trials

9.7.3

Electromagnetic interference (EMI)

Emission tests conform to the IEC61967-2 standard for board layout and pin loading. Worse

case EMI measurements are performed during maximum device activity.

Table 21. EMS data

Symbol

Parameter

Conditions

Level/class

VEFTB

Fast transient voltage burst limits to be

applied through 100pF on VDD and VSS pins

to induce a functional disturbance

VDD= 5 V, TA=+25 °C,

UFDFPN8 package, complies

with IEC 1000-4-4

Table 22. EMI data

Symbol

Parameter

General conditions

Monitored

frequency band

RCOSC =

1 MHz (1)

1. Data based on characterization results, not tested in production.

Unit

SEMI

Peak level

VDD = 5 V, TA = +25 °C,

UFDFPN8 package,

Complies with SAE

J1752/3, No finger on

touch electrode

0.1 MHz to 30 MHz

-4

dBµV

30 MHz to 130 MHz

-3

130 MHz to 1 GHz

-4

SAE EMI level

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