MCP1525ISLASHTT datasheet(4/20 Pages) MICROCHIP

4 / 20 page

MCP1525/41

DS21653C-page 4

 2001-2012 Microchip Technology Inc.

1.1.4

DROPOUT VOLTAGE

The dropout voltage of these devices is measured by

reducing VIN to the point where the output drops by 1%.

Under these conditions the dropout voltage is equal to:

EQUATION 1-2:

The

dropout

voltage

affected

ambient

temperature and load current.

In Figure 2-18, the dropout voltage is shown over a

negative and positive range of output current. For

currents above zero milliamps, the dropout voltage is

positive. In this case, the voltage reference is primarily

milliamps, the dropout voltage is negative. As the

output current becomes more negative, the input

current (IIN) reduces. Under this condition, the output

current begins to provide the needed power to the

voltage reference.

1.1.5

LINE REGULATION

Line regulation is a measure of the change in output

voltage (VOUT) as a function of a change in the input

voltage (VIN). This is expressed as VOUT/VIN and is

measured in either µV/V or ppm. For example, a 1 µV

change in VOUT caused by a 500 mV change in VIN

would net a

V

OUT/VIN of 2 µV/V, or 2 ppm.

1.1.6

LOAD REGULATION (

V

OUT/IOUT)

Load regulation is a measure of the change in the

output voltage (VOUT) as a function of the change in

output current (IOUT). Load regulation is usually

measured in mV/mA.

1.1.7

INPUT CURRENT

The input current (operating current) is the current that

sinks from VIN to VSS without a load current on the out-

put pin. This current is affected by temperature and the

output current.

1.1.8

INPUT VOLTAGE REJECTION

RATIO

The Input Voltage Rejection Ratio (IVRR) is a measure

of the change in output voltage versus the change in

input voltage over frequency, as shown in Figure 2-7.

The calculation used for this plot is:

EQUATION 1-3:

1.1.9

LONG-TERM OUTPUT STABILITY

The long-term output stability is measured by exposing

the devices to an ambient temperature of 125°C

(Figure 2-9) while configured in the circuit shown in

Figure 1-1. In this test, all electrical specifications of the

devices are measured periodically at +25°C.

FIGURE 1-1:

Dynamic Life Test

Configuration.

1.1.10

OUTPUT VOLTAGE HYSTERESIS

The output voltage hysteresis is a measure of the

output voltage error once the powered devices are

cycled over the entire operating temperature range.

The amount of hysteresis can be quantified by

measuring the change in the +25°C output voltage after

temperature excursions from +25°C to +85°C to +25°C

and also from +25°C to -40°C to +25°C.

DROP

OUT

–

IVRR

OUT

-------------

log



VSS

VOUT

VIN

VIN =5.5V

±2 mA

square wave

@10Hz

MCP1525

MCP1541

1µF

21653C.book Page 4 Thursday, January 10, 2013 12:55 PM

MCP1525I/TT датащи(PDF) 4 Page - Microchip Technology

MCP1525I/TT датащи(HTML) 4 Page - Microchip Technology

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20

датащи скачать

ссылки URL