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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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LQFP144 датащи(PDF) 82 Page - STMicroelectronics |
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LQFP144 датащи(HTML) 82 Page - STMicroelectronics |
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82 / 98 page  Electrical characteristics STM32F100xC, STM32F100xD, STM32F100xE 82/98 Doc ID 15081 Rev 7 Note: ADC accuracy vs. negative injection current: Injecting a negative current on any analog input pins should be avoided as this significantly reduces the accuracy of the conversion being performed on another analog input. It is recommended to add a Schottky diode (pin to ground) to analog pins which may potentially inject negative currents. Table 52. RAIN max for fADC = 12 MHz (1) 1. Guaranteed by design, not tested in production. Ts (cycles) tS (µs) RAIN max (kΩ) 1.5 0.125 0.4 7.5 0.625 5.9 13.5 1.125 11.4 28.5 2.375 25.2 41.5 3.45 37.2 55.5 4.625 50 71.5 5.96 NA 239.5 20 NA Table 53. ADC accuracy - limited test conditions(1)(2) 1. ADC DC accuracy values are measured after internal calibration. 2. Preliminary values. Symbol Parameter Test conditions Typ Max Unit ET Total unadjusted error fPCLK2 = 24 MHz, fADC = 12 MHz, RAIN < 10 kΩ, VDDA = 3 V to 3.6 V VREF+ = VDDA TA = 25 °C Measurements made after ADC calibration ±1.5 ±2.5 LSB EO Offset error ±1 ±2 EG Gain error ±0.5 ±1.5 ED Differential linearity error ±1.5 ±2 EL Integral linearity error ±1.5 ±2 Table 54. ADC accuracy(1) (2) (3) 1. ADC DC accuracy values are measured after internal calibration. 2. Better performance could be achieved in restricted VDD, frequency, VREF and temperature ranges. 3. Preliminary values. Symbol Parameter Test conditions Typ Max Unit ET Total unadjusted error fPCLK2 = 24 MHz, fADC = 12 MHz, RAIN < 10 kΩ, VDDA = 2.4 V to 3.6 V TA = Full operating range Measurements made after ADC calibration ±2 ±5 LSB EO Offset error ±1.5 ±2.5 EG Gain error ±1.5 ±3 ED Differential linearity error ±1.5 ±2.5 EL Integral linearity error ±1.5 ±4.5 |
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