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ATSAM3N00BA-MU датащи(PDF) 29 Page - ATMEL Corporation |
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ATSAM3N00BA-MU датащи(HTML) 29 Page - ATMEL Corporation |
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29 / 60 page ![]() 29 11011BS–ATARM–22-Feb-12 SAM3N Summary 7.7 Debug and Test Features • Debug access to all memory and registers in the system, including Cortex-M3 register bank when the core is running, halted, or held in reset. • Serial Wire Debug Port (SW-DP) and Serial Wire JTAG Debug Port (SWJ-DP) debug access • Flash Patch and Breakpoint (FPB) unit for implementing breakpoints and code patches • Data Watchpoint and Trace (DWT) unit for implementing watchpoints, data tracing, and system profiling • Instrumentation Trace Macrocell (ITM) for support of printf style debugging • IEEE1149.1 JTAG Boundary-can on All Digital Pins |
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