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OPA656 датащи(PDF) 13 Page - Texas Instruments |
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OPA656 датащи(HTML) 13 Page - Texas Instruments |
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13 / 25 page ![]() OPA656 13 SBOS196G www.ti.com the amplifier output and the capacitive load. This does not eliminate the pole from the loop response, but rather shifts it and adds a zero at a higher frequency. The additional zero acts to cancel the phase lag from the capacitive load pole, thus increasing the phase margin and improving stability. The Typical Characteristics show the recommended RS ver- sus Capacitive Load and the resulting frequency response at the load. In this case, a design target of a maximally flat frequency response was used. Lower values of RS may be used if some peaking can be tolerated. Also, operating at higher gains (than the +2 used in the Typical Characteristics) will require lower values of RS for a minimally peaked frequency response. Parasitic capacitive loads greater than 2pF can begin to degrade the performance of the OPA656. Long PC board traces, unmatched cables, and connections to multiple devices can easily cause this value to be ex- ceeded. Always consider this effect carefully, and add the recommended series resistor as close as possible to the OPA656 output pin (see Board Layout section). DISTORTION PERFORMANCE The OPA656 is capable of delivering a low distortion signal at high frequencies over a wide range of gains. The distortion plots in the Typical Characteristics show the typical distortion under a wide variety of conditions. Generally, until the fundamental signal reaches very high frequencies or powers, the 2nd-harmonic will dominate the distortion with negligible 3rd-harmonic component. Focusing then on the 2nd-harmonic, increasing the load impedance improves distortion directly. Remember that the total load includes the feedback network—in the noninverting configura- tion this is sum of RF + RG, while in the inverting configuration this is just RF (see Figure 1). Increasing output voltage swing increases harmonic distortion directly. A 6dB increase in output swing will generally increase the 2nd-harmonic 12dB and the 3rd-harmonic 18dB. Increasing the signal gain will also increase the 2nd-harmonic distortion. Again a 6dB increase in gain will increase the 2nd- and 3rd-harmonic by about 6dB even with a constant output power and frequency. And finally, the distortion increases as the fundamental frequency in- creases due to the rolloff in the loop gain with frequency. Conversely, the distortion will improve going to lower frequen- cies down to the dominant open loop pole at approximately 100kHz. Starting from the –70dBc 2nd-harmonic for a 5MHz, 2VPP fundamental into a 200Ω load at G = +2 (from the Typical Characteristics), the 2nd-harmonic distortion for frequencies lower than 100kHz will be < –105dBc. The OPA656 has an extremely low 3rd-order harmonic distortion. This also shows up in the 2-tone 3rd-order inter- modulation spurious (IM3) response curves. The 3rd-order spurious levels are extremely low (< –80dBc) at low output power levels. The output stage continues to hold them low even as the fundamental power reaches higher levels. As the Typical Characteristics show, the spurious intermodulation powers do not increase as predicted by a traditional intercept model. As the fundamental power level increases, the dy- namic range does not decrease significantly. For 2 tones centered at 10MHz, with 4dBm/tone into a matched 50 Ω load (that is, 1VPP for each tone at the load, which requires 4VPP for the overall 2-tone envelope at the output pin), the Typical Characteristics show a 78dBc difference between the test tone and the 3rd-order intermodulation spurious levels. This exceptional performance improves further when operating at lower frequencies and/or higher load impedances. DC ACCURACY AND OFFSET CONTROL The OPA656 can provide excellent DC accuracy due to its high open-loop gain, high common-mode rejection, high power-supply rejection, and its trimmed input offset voltage (and drift) along with the negligible errors introduced by the low input bias current. For the best DC precision, a high- grade version (OPA656UB or OPA656NB) screens the key DC parameters to an even tighter limits. Both standard- and high-grade versions take advantage of a new final test technique to 100% test input offset voltage drift over tem- perature. This discussion will use the high-grade typical and min/max electrical characteristics for illustration; however, an identical analysis applies to the standard-grade version. The total output DC offset voltage in any configuration and temperature will be the combination of a number of possible error terms. In a JFET part like the OPA656, the input bias current terms are typically quite low but are unmatched. Using bias current cancellation techniques, more typical in bipolar input amplifiers, does not improve output DC offset errors. Errors due to the input bias current will only become dominant at elevated temperatures. The OPA656 shows the typical 2x increase in every 10 °C common to JFET-input stage amplifiers. Using the 5pA maximum tested value at 25 °C, and a 20°C internal self heating (see thermal analysis), the maximum input bias current at 85 °C ambient will be 5pA • 2(105 – 25)/10 = 1280pA. For noninverting configurations, this term only begins to be a significant term versus the input offset voltage for source impedances > 750k Ω. This would also be the feedback-resistor value for transimpedance ap- plications (see Figure 3) where the output DC error due to inverting input bias current is on the order of that contributed by the input offset voltage. In general, except for these extremely high impedance values, the output DC errors due to the input bias current may be neglected. After the input offset voltage itself, the most significant term contributing to output offset voltage is the PSRR for the negative supply. This term is modeled as an input offset voltage shift due to changes in the negative power-supply voltage (and similarly for the +PSRR). The high-grade test limit for –PSRR is 62dB. This translates into 1.59mV/V input offset voltage shift = 10(–62/20). In the worst case, a ±0.38V ( ±7.6%) shift in the negative supply voltage will produce a ±0.6mV apparent input offset voltage shift. Since this is comparable to the tested limit of ±0.6mV input offset voltage, |
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