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RE46C145SW16F датащи(PDF) 10 Page - Microchip Technology

номер детали RE46C145SW16F
подробное описание детали  CMOS Photoelectric Smoke Detector ASIC with Interconnect and Timer Mode
PDF  26 Pages
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производитель  MICROCHIP [Microchip Technology]
домашняя страница  http://www.microchip.com
Logo MICROCHIP - Microchip Technology

RE46C145SW16F датащи(HTML) 10 Page - Microchip Technology

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RE46C145
DS22181C-page 10
 2009-2012 Microchip Technology Inc.
3.6
Low Battery Detection
In standby, an internal reference is compared to the
voltage divided VDD supply. A low battery status is
latched at the conclusion of the LED pulse. The horn
will chirp for 10 ms every 43 seconds, until the low
battery condition no longer exists. The low battery test
is not performed in a local or remote alarm condition.
The low battery notification does not sound in a local or
remote alarm condition.
3.7
Chamber Fail Detection
In standby, a chamber test is also performed every
43 seconds, by switching to the high gain capacitor C1
and
sensing
the
photo
chamber
background
reflections. Two consecutive chamber test failures will
also cause the horn to chirp for 10 ms every
43 seconds. The low battery chirp occurs just before
the LED pulse (see Figure 3-1). The chamber test and
chamber test failure chirp occurs approximately
21 seconds after the LED pulse. The chamber tests are
not performed in a local or remote alarm condition.
The chamber fail notification does not sound in a local
or remote alarm condition.
3.8
Timer Mode
If resistors RADJ1 and RADJ2 are in place and a high-to-
low transition occurs on the TEST input, the device
enters a 10 minute timer mode. In this mode, the
smoke comparator reference is switched from the
internal VDD - 3.5V reference to the voltage that
appears on VSEN (pin 15). This allows the sensitivity to
be modified for the duration of the 9 minute timer
period. The chamber test is performed in Timer mode.
If VSEN is left unconnected or tied to VSS, the Timer
mode of operation is inhibited.
3.9
Diagnostic Mode
In addition to the normal function of the TEST input, a
special diagnostic mode is available to calibrate and
test of the smoke detector. Taking the TEST pin below
VSS and sourcing ~200 µA out of the pin for 1 clock
cycle will enable the diagnostic mode. In the diagnostic
mode, some of the pin functions are redefined. Refer to
Table 3-1 for redefined pin functions in the diagnostic
mode. In addition, in this mode STROBE is always
enabled, and the IRED is pulsed at the clock rate of
10 ms nominal.
TABLE 3-1:
DIAGNOSTIC MODE PIN FUNCTION
Pin Name
Pin
Number
Function
IO
7
The IO pin (7) controls the gain capacitor used for the photo amplifier. If IO is low, then
normal gain is selected. If IO is high, then high gain is selected.
VSEN
15
In Diagnostic mode, the output of the photo amplifier is gated to this pin and the pull-
down device is disabled. .
FEED
10
If the IO pin (7) is low, then taking this input high will enable hysteresis, which is a
nominal 10% gain increase in Normal Gain mode.
COSC
12
If desired, this pin can be driven by an external clock.
HORNB
8
This pin becomes the smoke integrator output. A high level indicates that an alarm
condition has been detected.
LED
11
The LED pin is used as a low battery indicator. For VDD above the low battery thresh-
old, the open drain NMOS is off. If VDD falls below the threshold, the NMOS turns on.



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