7

Agere Systems Inc.

Advance Data Sheet

August 2001

P172-Type Receiver

Qualification Information

The P172-type receiver is scheduled to complete the following qualification tests and meet the intent of

Telcordia

Table 4. P172Type Qualification Information

Test

Reference

Conditions

Sample Size

Pass/Fail Criteria

Mechanical Shock

and Vibration

Telcordia Technologies

GR-468-CORE,

Section 8.3.2

500 g, 0.5 ms

Condition A, 20 g,

20 Hz to 2000 Hz,

4 min./cycle,

4 cycles

11

10% Responsivity

Change After Completion

of Both Tests

Thermal Shock

MIL-STD-883

Method 1011

0

°C to 100 °C,

20 cycles

11

Physical Attributes and

Leak Check

Lead Integrity

MIL-STD-883

Method 2004

Condition A

To Be Provided by

the Supplier

—

Solderability

MIL-STD-883

Method 2003

—To Be Provided by

the Supplier

—

Low Temperature

Storage

—

–40

°C storage

2000 hours

11

10% Responsivity

Change After Completion

of Test

High Temperature

Storage

—

85

°C storage

2000 hours

11

10% Responsivity

Change After Completion

of Test

Temperature

Cycling

Telcordia Technologies

GR-468-CORE,

Section 5.20

–40

°C to +85 °C,

500 cycles

11

10% Responsivity

Change After Completion

of Test

Damp Heat

MIL-STD-883

Method 103

85

°C/85% RH

1000 hours

11

10% Responsivity

Change After Completion

of Test

Cyclic Moisture

Resistance

Telcordia Technologies

GR-468-CORE,

Section 5.23

—

11

10% Responsivity

Change After Completion

of Test

ESD Threshold

Telcordia Technologies

GR-468-CORE,

Section 5.22

—6

Internal Moisture

MIL-STD-883

Method 1018

—

11 Pieces After

Thermal Shock

Test

Max 5000 ppm Water

Vapor After Other Test

Cells