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LTM8048 датащи(PDF) 16 Page - Linear Technology |
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LTM8048 датащи(HTML) 16 Page - Linear Technology |
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16 / 22 page ![]() LTM8045 16 8045fa For more information www.linear.com/8045 APPLICATIONS INFORMATION Hot-Plugging Safely The small size, robustness and low impedance of ceramic capacitors make them an attractive option for the input bypass capacitor of the LTM8045. However, these capaci- tors can cause problems if the LTM8045 is plugged into a live input supply (see Application Note 88 for a complete discussion).Thelowlossceramiccapacitorcombinedwith stray inductance in series with the power source forms an underdamped tank circuit, and the voltage at the VIN pin of the LTM8045 can ring to more than twice the nominal input voltage, possibly exceeding the LTM8045’s rating and damaging the part. If the input supply is poorly con- trolled or the user will be plugging the LTM8045 into an energized supply, the input network should be designed to prevent this overshoot. This can be accomplished by installing a small resistor in series with VIN, but the most popular method of controlling input voltage overshoot is to add an electrolytic bulk capacitor to the VIN net. This capacitor’s relatively high equivalent series resistance damps the circuit and eliminates the voltage overshoot. The extra capacitor improves low frequency ripple filter- ing and can slightly improve the efficiency of the circuit, though it is physically large. Thermal Considerations The LTM8045 output current may need to be derated if it is required to operate in a high ambient temperature or deliver a large amount of continuous power. The amount of current derating is dependent upon the input voltage, output power and ambient temperature. The temperature rise curves given in the Typical Performance Character- istics section can be used as a guide. These curves were generated by a LTM8045 mounted to a 25.8cm2 4-layer FR4 printed circuit board with a copper thickness of 2oz for the top and bottom layer and 1oz for the inner layers. Boards of other sizes and layer count can exhibit differ- ent thermal behavior, so it is incumbent upon the user to verify proper operation over the intended system’s line, load and environmental operating conditions. ThethermalresistancenumberslistedinthePinConfigura- tion section of the data sheet are based on modeling the µModule package mounted on a test board specified per JESD 51-9 (“Test Boards for Area Array Surface Mount PackageThermalMeasurements”).Thethermalcoefficients provided in this page are based on JESD 51-12 (“Guide- lines for Reporting and Using Electronic Package Thermal Information”). Forincreasedaccuracyandfidelitytotheactualapplication, many designers use FEA to predict thermal performance. To that end, the Pin Configuration section of the data sheet typically gives four thermal coefficients: • θJA – Thermal resistance from junction to ambient • θJCbottom – Thermal resistance from junction to the bottom of the product case • θJCtop – Thermal resistance from junction to top of the product case • θJB – Thermal resistance from junction to the printed circuit board. While the meaning of each of these coefficients may seem to be intuitive, JEDEC has defined each to avoid confusion and inconsistency. These definitions are given in JESD 51-12, and are quoted or paraphrased below: • θJA is the natural convection junction-to-ambient air thermal resistance measured in a one cubic foot sealed enclosure.Thisenvironmentissometimesreferredtoas “still air” although natural convection causes the air to move.Thisvalueisdeterminedwiththepartmountedto a JESD 51-9 defined test board, which does not reflect an actual application or viable operating condition. • θJCbottomisthethermalresistancebetweenthejunction and bottom of the package with all of the component power dissipation flowing through the bottom of the package. In the typical µModule converter, the bulk of the heat flows out the bottom of the package, but there is always heat flow out into the ambient environment. As a result, this thermal resistance value may be useful for comparing packages but the test conditions don’t generally match the user’s application. |
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