LM60/LM60-Q1

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SNIS119D – MAY 2004 – REVISED NOVEMBER 2012

ELECTRICAL CHARACTERISTICS

LM60B

LM60C/LM60-Q1

PARAMETER

CONDITIONS

UNITS (Limit)

±2.0

±3.0

°C (max)

±3.0

±4.0

°C (max)

Output Voltage at 0°C

+424

mV

±0.6

±0.8

°C (max)

+6.25

6.06

6

mV/°C (min)

Sensor Gain (Average Slope)

6.44

6.5

mV/°C (max)

Output Impedance

800

800

Ω (max)

+3.0 V

±0.3

±0.3

mV/V (max)

+2.7 V

±2.3

±2.3

mV (max)

+2.7 V

82

110

110

μA (max)

Quiescent Current

125

125

μA (max)

Change of Quiescent Current

+2.7 V

±5.0

μA (max)

Temperature Coefficient of Quiescent Current

0.2

μA/°C

±0.2

°C

for 1000 hours

(1)

(2)

Limits are specified to National's AOQL (Average Outgoing Quality Level).

(3)

Accuracy is defined as the error between the output voltage and +6.25 mV/°C times the device's case temperature plus 424 mV, at

specified conditions of voltage, current, and temperature (expressed in °C).

(4)

Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the device's

rated temperature range.

(5)

Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating

effects can be computed by multiplying the internal dissipation by the thermal resistance.

(6)

For best long-term stability, any precision circuit will give best results if the unit is aged at a warm temperature, and/or temperature

cycled for at least 46 hours before long-term life test begins. This is especially true when a small (Surface-Mount) part is wave-soldered;

allow time for stress relaxation to occur. The majority of the drift will occur in the first 1000 hours at elevated temperatures. The drift after

1000 hours will not continue at the first 1000 hour rate.

Copyright © 2004–2012, Texas Instruments Incorporated

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