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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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ADG783BCP датащи(PDF) 7 Page - Analog Devices |
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ADG783BCP датащи(HTML) 7 Page - Analog Devices |
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7 / 8 page  REV. A ADG781/ADG782/ADG783 –7– Test Circuits IDS V1 SD VS RON = V1/IDS Test Circuit 1. On Resistance VD IS (OFF) ID (OFF) SD VS A A Test Circuit 2. Off Leakage 0.1 F VS IN S D VDD GND RL 300 CL 35pF VOUT VDD ADG781 ADG782 VIN VIN VOUT tON tOFF 50% 50% 90% 90% 50% 50% VS Test Circuit 4. Switching Times S1 D1 0.1 F VDD IN1, IN2 VS1 GND RL1 300 CL1 35pF VOUT1 VS2 VOUT2 RL2 300 CL2 35pF S2 VIN D2 VDD ADG783 tD tD 50% 50% 90% VIN VOUT1 VOUT2 90% 90% 90% 0V 0V 0V Test Circuit 5. Break-Before-Make Time Delay, tD ID (ON) SD A VD NC NC = NO CONNECT Test Circuit 3. On Leakage VOUT VOUT QINJ = CL VOUT SW ON VIN SW OFF S D VDD IN RS GND VS VOUT CL 1nF VDD Test Circuit 6. Charge Injection VS VOUT 50 NETWORK ANALYZER RL 50 GND S D VS OFF ISOLATION = 20 LOG VOUT 0.1 F VDD VDD 50 VIN IN Test Circuit 7. Off Isolation CHANNEL-TO-CHANNEL CROSSTALK = 20 LOG VOUT VS GND S1 D2 S2 NETWORK ANALYZER IN D1 NC VOUT RL 50 0.1 F VDD VDD 50 RL 50 VS Test Circuit 8. Channel-to-Channel Crosstalk |
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