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ADF4106 датащи(PDF) 3 Page - Analog Devices |
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ADF4106 датащи(HTML) 3 Page - Analog Devices |
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3 / 20 page ![]() –3– REV. 0 BChips 2 Parameter B Version1 (typ) Unit Test Conditions/Comments NOISE CHARACTERISTICS ADF4106 Phase Noise Floor 9 –174 –174 dBc/Hz typ @ 25 kHz PFD Frequency –166 –166 dBc/Hz typ @ 200 kHz PFD Frequency –159 –159 dBc/Hz typ @ 1 MHz PFD Frequency Phase Noise Performance 10 @ VCO Output 900 MHz Output 11 –93 –93 dBc/Hz typ @ 1 kHz Offset and 200 kHz PFD Frequency 5800 MHz Output 12 –74 –74 dBc/Hz typ @ 1 kHz Offset and 200 kHz PFD Frequency 5800 MHz Output 13 –84 –84 dBc/Hz typ @ 1 kHz Offset and 1 MHz PFD Frequency Spurious Signals 900 MHz Output 11 –90/–92 –90/–92 dBc typ @ 200 kHz/400 kHz and 200 kHz PFD Frequency 5800 MHz Output 12 –65/–70 –65/–70 dBc typ @ 200 kHz/400 kHz and 200 kHz PFD Frequency 5800 MHz Output 13 –70/–75 –70/–75 dBc typ @ 1 MHz/2 MHz and 1 MHz PFD Frequency NOTES 1Operating temperature range (B Version) is –40 °C to +85°C. 2The BChip specifications are given as typical values. 3Use a square wave for lower frequencies, below the mimimum stated. 4This is the maximum operating frequency of the CMOS counters. The prescaler value should be chosen to ensure that the RF input is divided down to a frequency that is less than this value. 5AV DD = DVDD = 3 V 6Guaranteed by design. Sample tested to ensure compliance. 7T A = 25 °C; AV DD = DVDD = 3 V; P = 16; RFIN = 6.0 GHz 8T A = 25 °C; AV DD = DVDD = 3.3 V; R = 16383; A = 63; B = 891; P = 32; RF IN = 6.0 GHz 9The synthesizer phase noise floor is estimated by measuring the in-band phase noise at the output of the VCO and subtracting 20logN (where N is the N divider value). 10The phase noise is measured with the EVAL-ADF4106EB1 Evaluation Board and the HP8562E Spectrum Analyzer. The spectrum analyzer provides the REFIN for the synthesizer (fREFOUT = 10 MHz @ 0 dBm). 11f REFIN = 10 MHz; fPFD = 200 kHz; Offset Frequency = 1 kHz; f RF = 900 MHz; N = 4500; Loop B/W = 20 kHz 12f REFIN = 10 MHz; fPFD = 200 kHz; Offset Frequency = 1 kHz; f RF = 5800 MHz; N = 29000; Loop B/W = 20 kHz 13f REFIN = 10 MHz; fPFD = 1 MHz; Offset Frequency = 1 kHz; f RF = 5800 MHz; N = 5800; Loop B/W = 100 kHz Specifications subject to change without notice. (AVDD = DVDD = 3 V 10%; AVDD ≤ VP ≤ 5.5 V; AGND = DGND = CPGND = 0 V; R SET = 5.1 k ; TA = TMIN to TMAX unless otherwise noted.) CLOCK DB23 (MSB) DB22 DB2 DB1 (CONTROL BIT C2) t 5 DATA LE DB0 (LSB) (CONTROL BIT C1) t 6 t 1 t2 t 3 t 4 LE Figure 1. Timing Diagram TIMING CHARACTERISTICS Limit at TMIN to TMAX Parameter (B Version) Unit Test Conditions/Comments t1 10 ns min DATA to CLOCK Setup Time t2 10 ns min DATA to CLOCK Hold Time t3 25 ns min CLOCK High Duration t4 25 ns min CLOCK Low Duration t5 10 ns min CLOCK to LE Setup Time t6 20 ns min LE Pulsewidth Guaranteed by design but not production tested. ADF4106 |
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